Invention Application
- Patent Title: PROBE, INSPECTION JIG, AND INSPECTION APPARATUS
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Application No.: US16504323Application Date: 2019-07-07
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Publication No.: US20200018779A1Publication Date: 2020-01-16
- Inventor: Minoru KATO , Tadakazu MIYATAKE , Akio HAYASHI , Masaki NAGANUMA , Matthias Joseph Chin Chieh Chia , Cheng Ghee Ong , Raminderjit Singh
- Applicant: Nidec-Read Corporation , Nidec SV Probe Pte. Ltd.
- Applicant Address: JP Kyoto SG Singapore
- Assignee: Nidec-Read Corporation,Nidec SV Probe Pte. Ltd.
- Current Assignee: Nidec-Read Corporation,Nidec SV Probe Pte. Ltd.
- Current Assignee Address: JP Kyoto SG Singapore
- Priority: JP2018-133736 20180713
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R31/04 ; G01R1/073

Abstract:
A probe is a probe having a substantially bar-like shape and includes a distal end portion with a substantially columnar shape adapted to be in contact with an inspection point provided on a device under test, a base end portion with a substantially columnar shape on an opposite side of the distal end portion, and a main body portion formed in a flat ribbon shape and extended to connect the distal end portion to the base end portion. The distal end portion is provided with a distal end surface inclined relative to and intersecting with an axial center of the probe.
Public/Granted literature
- US11009523B2 Probe, inspection jig, and inspection apparatus Public/Granted day:2021-05-18
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