公开(公告)号：US20220034938A1

公开(公告)日：2022-02-03

申请号：US17386567

申请日：2021-07-28

Applicant: NIDEC READ CORPORATION

Inventor： Kohei TSUMURA ,  Takanori FURUKAWA ,  Jyun YAMANOUCHI

IPC: G01R1/073 ,  G01R31/28

Abstract: Provided are an inspection jig and an inspection apparatus in which a configuration for bending a plurality of contacts in the same direction can be simplified. The inspection jig includes a plurality of contacts each of which has a rod shape, a first support portion that supports the first end portion side of the plurality of contacts, and a second support portion that supports the second end portion side of the plurality of contacts. The first support portion includes a facing support plate that is disposed to face the second support portion in a manner separated from the second support portion and has a plurality of through holes through which the plurality of contacts are inserted, and a cross section of each of the through holes has an elliptical shape whose major axis extends in a predetermined specific direction along a plane direction of the facing support plate.

公开(公告)号：US20230138341A1

公开(公告)日：2023-05-04

申请号：US17917950

申请日：2021-04-19

Applicant: NIDEC READ CORPORATION

Inventor： Kohei TSUMURA ,  Hidekazu YAMAZAKI

IPC: G01R1/067

Abstract: An inspection jig includes a rod-shaped probe, a first support portion that supports one end portion side of the probe, a second support portion that supports the other end portion side of the probe, and a separation holding member that holds the first support portion and the second support portion to be separated from each other. The first support portion includes a support plate in which a through hole through which the probe is inserted is formed. A reinforcing plate having bending strength stronger than that of the support plate is disposed on a surface of the support plate facing the second support portion.

公开(公告)号：US20230117705A1

公开(公告)日：2023-04-20

申请号：US17910353

申请日：2021-02-22

Applicant: NIDEC READ CORPORATION

Inventor： Kohei TSUMURA

IPC: G01R1/073 ,  G01R31/28

Abstract: An inspection jig includes a first board, a probe unit including a probe, a second board located in parallel with the first board and electrically connected to the probe, an electrical connection portion electrically connecting the first board and the second board, and a board holding portion holding the second board in parallel with the first board in the thickness direction and holding the probe unit. The board holding portion includes a probe-side holding plate located on the probe unit side of the second board and a holding plate support portion that positions the probe-side holding plate at a position where the probe-side holding plate is in parallel with the first board in the thickness direction. The board holding portion holds the second board so that the first board and the second board are electrically connected via the electrical connection portion being sandwiched between the first board and second board.

公开(公告)号：US20230127957A1

公开(公告)日：2023-04-27

申请号：US17910363

申请日：2021-02-22

Applicant: NIDEC READ CORPORATION

Inventor： Kohei TSUMURA

IPC: G01R31/28 ,  G01R1/073

Abstract: A circuit board inspection apparatus includes an inspection processing portion that inspects an electric circuit of a board to be inspected, an inspection jig, and a position detector used to position the inspection processing portion relative to the board to be inspected. The inspection jig includes a probe unit having a probe, a first board, a second board located in parallel with the first board in a thickness direction of the first board, an electrical connection portion that electrically connects the first board and the second board, and a second board holding portion that holds the second board from the first board and holds the probe unit on a side opposite to the first board side. The second board holding portion has a position detection opening penetrating in the thickness direction, at a position overlapping the position detector as viewed from the thickness direction of the second board holding portion.

公开(公告)号：US20150123693A1

公开(公告)日：2015-05-07

申请号：US14530850

申请日：2014-11-03

Applicant: NIDEC-READ CORPORATION

Inventor： Norihiro OTA ,  Mitsunobu TOKIMASA ,  Kosuke HIROBE ,  Kohei TSUMURA

IPC: G01R1/04 ,  G01R31/28

CPC classification number: G01R31/2808 ,  G01R1/07357 ,  G01R31/2801 ,  G01R31/2886

Abstract: An inspection jig may include a frame, an electrode body provided with electrodes, conductive contactors having a wire shape, a support block having a facing surface opposite to which an inspection circuit board is disposed, guiding one ends of the contactors to the inspection points of the circuit board mounted on the facing surface, guiding other ends to the electrodes, and configured to move relatively to the frame in a moving direction which crosses the facing surface, biasing parts configured to bias the support block in a direction moving away from the electrode body and close to the circuit board, and a regulating plate disposed between the support block and the frame so as to extend in a direction from the support block to the frame, having elasticity, and having regulation of deformation in a first direction which is parallel to the facing surface and which crosses the extending direction.

Abstract translation: 检查夹具可以包括框架，设置有电极的电极体，具有导线形状的导电接触器，具有与设置有检查电路板相对的相对表面的支撑块，将接触器的一端引导到 所述电路板安装在所述面对表面上，将其他端部引导到所述电极，并且被构造成在与所述相对表面相交的移动方向上相对于所述框架移动，偏置部件被配置为在远离所述电极的方向偏置所述支撑块 并且靠近电路板，以及调节板，其设置在支撑块和框架之间，以沿着从支撑块到框架的方向延伸，具有弹性，并且具有在平行的第一方向上的变形调节 到达所述面对表面并且穿过所述延伸方向。