公开(公告)号：US20040252748A1

公开(公告)日：2004-12-16

申请号：US10461977

申请日：2003-06-13

Inventor： Daniel D. Gleitman

IPC: G01K011/00 ,  G01J005/00

CPC classification number: G01V8/16 ,  E21B47/06 ,  E21B47/065 ,  E21B47/123 ,  E21B49/00 ,  G01K13/02 ,  G01N21/645 ,  G01N21/71 ,  G01N21/77 ,  G01N2021/7786

Abstract: Fiber optic sensing systems and methods. In a described embodiment, a fiber optic sensing system includes an optical fiber transmitting energy to a chemical vapor deposited diamond material proximate a substance in a well. The diamond material is deposited as a coating on a substrate. The substrate and coating are heated when the energy is transmitted by the optical fiber. This heats the substance in the well, which is detected to determine a property of the substance. In another embodiment, light energy is transmitted through the diamond material.

Abstract translation: 光纤传感系统和方法。 在所描述的实施例中，光纤传感系统包括将能量传递到靠近井中物质的化学气相沉积金刚石材料的光纤。 金刚石材料作为涂层沉积在基底上。 当能量被光纤传播时，衬底和涂层被加热。 这加热了井中的物质，这被检测以确定物质的性质。 在另一实施例中，光能透过金刚石材料。

公开(公告)号：US20040240516A1

公开(公告)日：2004-12-02

申请号：US10480428

申请日：2003-12-10

Inventor： James Harr

IPC: G01J005/00

CPC classification number: G01J5/04 ,  G01J5/02 ,  G01J5/021 ,  G01J5/049 ,  G01J5/06 ,  G01J5/061

Abstract: The present disclosure provides a tympanic thermometer including a heat sensing probe defining a longitudinal axis and an outer surface extending from a distal end of the tympanic thermometer. The heat sensing probe includes a sensor housing extending to a distal end thereof. A sensor can is mounted with the sensor housing and a nozzle is mounted onto the sensor housing. The sensor can includes temperature sensing electronics for sensing temperature via the heat sensing probe. The nozzle includes a base disposed with the sensor housing and an elongated cylindrical nose portion disposed about the sensor housing. The nozzle is configured to direct heat flux to the distal end of the heat sensing probe. A probe cover is mountable to the distal end of the tympanic thermometer. The probe cover has an inner surface configured to engage an outer surface of the nozzle. The sensor can preferably include a lip extending radially therefrom and contacting the nozzle at at least one contact point to provide heat flux to the sensor can.

Abstract translation: 本公开提供一种鼓膜温度计，其包括限定纵向轴线的热感测探针和从鼓室温度计的远端延伸的外表面。 热传感探头包括延伸到其远端的传感器壳体。 传感器壳体安装有传感器外壳，喷嘴安装在传感器外壳上。 传感器可以包括用于通过热感测探头感测温度的温度感测电路。 喷嘴包括设置有传感器壳体的基部和围绕传感器壳体设置的细长圆柱形鼻部。 喷嘴构造成将热通量引导到热感测探头的远端。 探头盖可安装到鼓膜温度计的远端。 探针盖具有构造成接合喷嘴的外表面的内表面。 传感器可以优选地包括从其径向延伸的唇缘，并且在至少一个接触点处接触喷嘴以向传感器罐提供热通量。

公开(公告)号：US20040226936A1

公开(公告)日：2004-11-18

申请号：US10795347

申请日：2004-03-09

Inventor： Kenichi Oyama ,  Atsushi Someya ,  Yuko Yamaguchi

IPC: H05B003/68 ,  H05B003/02 ,  H05B001/02 ,  G01J005/00

CPC classification number: H01L21/67248 ,  H01L21/67103 ,  H01L21/67109 ,  H05B3/68

Abstract: There is provided a semiconductor wafer heat treatment apparatus and method, which can carry out a heat treatment to suppress variations in line widths within surface on a semiconductor wafer and the like, which includes: a heating plate for heating a semiconductor wafer to a predetermined temperature; a temperature measuring unit for measuring temperatures when heating the semiconductor wafer or a semiconductor wafer equivalent placed on the heating plate, at portions divided into a plurality of regions; and a controller for controlling the temperatures of the semiconductor wafer, and based on the temperature measurement result of the temperature measuring unit, the controller controls the temperature in heating the semiconductor wafer, for each of the plurality of regions. In cooling after the heating process, based on the temperature measurement result, the controller controls the temperature in cooling the semiconductor wafer, for each of the plurality of regions.

Abstract translation: 提供一种半导体晶片热处理装置和方法，其可以进行热处理以抑制半导体晶片等的表面内的线宽度的变化，其包括：用于将半导体晶片加热到预定温度的加热板 ; 温度测量单元，用于在分成多个区域的部分测量加热半导体晶片或放置在加热板上的半导体晶片等效物时的温度; 以及用于控制半导体晶片的温度的控制器，并且基于温度测量单元的温度测量结果，控制器控制对于多个区域中的每个区域加热半导体晶片的温度。 在加热处理后的冷却中，基于温度测量结果，控制器控制对于多个区域中的每个区域来冷却半导体晶片的温度。

公开(公告)号：US20040195509A1

公开(公告)日：2004-10-07

申请号：US10829574

申请日：2004-04-22

Inventor： Mani Sundaram ,  Axel R. Reisinger

IPC: G01J005/00 ,  H01L029/06

CPC classification number: G01J3/2803 ,  B82Y20/00 ,  H01L27/1465 ,  H01L27/14652 ,  H01L31/02161 ,  H01L31/02327 ,  H01L31/03046 ,  H01L31/035236 ,  H01L31/1013 ,  Y02E10/544

Abstract: A tunable QWIP FPA device that is configured for spectral tunability for performing the likes of imaging and spectroscopy is disclosed. A selected bias voltage is applied across the contacts associated with a particular detector layer/channel of the device, where each applied bias corresponds to a particular target spectrum/color for detection. Each detector layer/channel can be coarse tuned for a bimodal or dual-band operation (e.g., MWIR/LWIR). Also, each detector layer/channel is configured for continuous or fine tuning within a particular mode (e.g., MWIR/MWIR). Thus, dynamic bias-controlled tuning is enabled. Asymmetric quantum well configurations enable this tunability.

Abstract translation: 公开了一种可调QWIP FPA设备，其配置用于执行像成像和光谱学的光谱可调性。 选择的偏置电压施加在与装置的特定检测器层/通道相关联的触点上，其中每个施加的偏置对应于用于检测的特定目标光谱/颜色。 每个检测器层/通道可以被粗调以进行双峰或双频段操作（例如，MWIR / LWIR）。 此外，每个检测器层/通道被配置为在特定模式（例如，MWIR / MWIR）内进行连续或微调。 因此，启用动态偏置控制调谐。 不对称量子阱配置可实现这种可调性。

公开(公告)号：US20040190586A1

公开(公告)日：2004-09-30

申请号：US10708571

申请日：2004-03-11

Inventor： Peng Lee ,  Kevin J. Seddon

IPC: G01N025/72 ,  G01J005/00

CPC classification number: G01N25/72

Abstract: This invention provides an apparatus for nondestructive residential inspection and various methods for using a thermal imaging apparatus coupled to inspect exterior residential components, interior residential components, a pitched roof and basement of a residential building and the electrical system of a residential building.

Abstract translation: 本发明提供了一种用于非破坏性住宅检查的装置，以及使用耦合以检查住宅建筑物的外部住宅部件，室内住宅部件，倾斜屋顶和地下室以及住宅建筑物的电气系统的热成像设备的各种方法。

公开(公告)号：US20040188616A1

公开(公告)日：2004-09-30

申请号：US10402586

申请日：2003-03-28

Inventor： Chunwu Wu ,  Waldean A. Schulz

IPC: G01J005/00

CPC classification number: G01S3/7835 ,  G01S5/16

Abstract: A sensor for determining a component of a location of a radiation source within a three dimensional volume includes a mask having a series of openings that has a predetermined mathematical relationship among the openings within the series of openings and defines a mask reference line; a detector surface spaced from the mask where radiation passing through the mask creates a mask image on the detector surface having a series of peaks and an image reference line within the mask image that can be located and where at least 50% of the mask image is projected onto the detection surface; and a calculating unit to determine a location of the image reference line within the mask image and the component of the location of the radiation source from the calculated location of the image reference line within the mask image. A method and system for using this sensor are also disclosed.

Abstract translation: 用于确定三维体积内的辐射源的位置的分量的传感器包括具有一系列开口的掩模，所述开口在所述一系列开口内的所述开口之间具有预定的数学关系并且限定掩模参考线; 与掩模间隔开的检测器表面，其中通过掩模的辐射在检测器表面上产生掩模图像，该掩模图像具有一系列峰值和可以位于掩模图像内的图像参考线，并且其中至少50％的掩模图像是 投影到检测面上; 以及计算单元，用于从掩模图像内的图像参考线的计算位置确定掩模图像内的图像参考线的位置和辐射源的位置的分量。 还公开了一种使用该传感器的方法和系统。

公开(公告)号：US20040184508A1

公开(公告)日：2004-09-23

申请号：US10395401

申请日：2003-03-21

Applicant: ASM Assembly Automation Ltd.

Inventor： Ching Man Stanley Tsui ,  Sai Kit Wong ,  Shing Kai Yip

IPC: G01J005/00 ,  G01K007/00

CPC classification number: G01R31/2874 ,  G01J5/00 ,  G01J5/0096 ,  G01J5/12 ,  G01R1/0458 ,  G01R31/2867 ,  G01R31/3025

Abstract: The invention provides a temperature monitoring system for a semiconductor test handler. A preparation stage brings a test device to a predetermined temperature for testing at a test platform at said predetermined temperature. At least one radiation sensor, such as a thermopile device, is employed in the test handler for detecting a surface temperature of the test device by measuring radiation emitted from the test device.

Abstract translation: 本发明提供了一种用于半导体测试处理器的温度监测系统。 准备阶段使测试装置达到预定温度，以在测试台在所述预定温度下进行测试。 在测试处理器中采用至少一个辐射传感器，例如热电堆设备，用于通过测量从测试设备发出的辐射来检测测试设备的表面温度。

公开(公告)号：US20040161017A1

公开(公告)日：2004-08-19

申请号：US10780933

申请日：2004-02-17

Inventor： Hsiao Yi Chang ,  Chu Yih Yu

IPC: G01J005/00 ,  G01K007/00 ,  G01K001/00

CPC classification number: G01K1/18 ,  G01K13/002

Abstract: A temperature probe for use in a medical thermometer. The temperature probe includes a probe body and a hollow tip member secured to the probe body. The hollow tip member further has an outer wall as a thermal contact surface, an inner wall inside the outer wall, a thermal isolation space formed between the outer wall and the inner wall, and a hollow cavity surrounded by the inner wall. A thermal sensor is disposed within the hollow tip member so as to sense the temperature of the thermal contact surface and produce a temperature signal. A set of transmission wires is connected to the thermal sensor to pass the temperature signal.

Abstract translation: 用于医用温度计的温度探头。 温度探头包括探针体和固定到探针体的中空尖端部件。 中空的顶端构件还具有作为热接触面的外壁，外壁内的内壁，形成在外壁和内壁之间的隔热空间以及被内壁包围的中空腔。 热传感器设置在中空尖端构件内，以便感测热接触表面的温度并产生温度信号。 一组传输线连接到热传感器以传递温度信号。

公开(公告)号：US20040099809A1

公开(公告)日：2004-05-27

申请号：US10630621

申请日：2003-07-30

Inventor： Gregoire Verrier ,  Nicolas Vezard

IPC: G01J005/00

CPC classification number: G02B23/12 ,  C07K14/47

Abstract: An electrically powered image intensifier having an output and an input is optically coupled to a zoom lens to receive the focused light image from the lens and provide at the output of the image intensifier an intensified light image. A chassis is configured to support the intensifier and to mainly engage the lens by engaging the mounting structure. The lens is engaged by the mounting structure in a use position, and may be supported by a tripod. The use of the zoom lens allows convenient use in cramped quarters at a short focal length setting, i.e. at a wide angle setting. The intensifier may be used at a distance at a long focal length setting, i.e. at a telephoto setting, advantageously with a tripod and a standard panning handle.

Abstract translation: 具有输出和输入的电动图像增强器光耦合到变焦透镜以从透镜接收聚焦光图像，并在图像增强器的输出处提供增强的光图像。 底盘配置成支撑增压器，并通过接合安装结构主要与透镜接合。 透镜由安装结构接合在使用位置，并且可以由三脚架支撑。 使用变焦镜头允许在狭窄的焦距设置（即，广角设置）下方便地使用狭窄的区域。 增强器可以在长焦距设置的距离，即在远摄设置下，有利地使用三脚架和标准摇摄手柄。

公开(公告)号：US20040052297A1

公开(公告)日：2004-03-18

申请号：US10440453

申请日：2003-05-16

Applicant: RAYTEK

Inventor： Quint McDonald ,  Nick Wigen

IPC: G01J005/00

CPC classification number: G01J5/0003

Abstract: A thermal monitoring system, including multiple infrared sensors, performs real-time monitoring and alarming for any out of tolerance thermal conditions occurring during a manufacturing process.

Abstract translation: 包括多个红外传感器的热监测系统对于在制造过程中发生的任何超出公差热条件，都可以进行实时监控和报警。