Array substrate and chip bonding method

    公开(公告)号:US11101230B2

    公开(公告)日:2021-08-24

    申请号:US16308484

    申请日:2018-09-27

    Abstract: The invention provides an array substrate and chip bonding method, the array substrate comprising: an active area, and a bonding area located around the active area, wherein the bonding area is provided with an input terminal group, a first output terminal group and a second output terminal a group; the first output terminal group is located at a side of the input terminal group away from the active area, and the second output terminal group is located between the first output terminal group and the input terminal group; when bonding chips, the first output terminal group or the second output terminal group is selected to cooperate with the input terminal group for chip bonding according to the chip type. By simultaneously providing the first and second output terminal groups, the bonding of the second type chip increases the distance between the chip and the edge of the array substrate.

    ARRAY SUBSTRATE AND CHIP BONDING METHOD

    公开(公告)号:US20210091027A1

    公开(公告)日:2021-03-25

    申请号:US16308484

    申请日:2018-09-27

    Abstract: The invention provides an array substrate and chip bonding method, the array substrate comprising: an active area, and a bonding area located around the active area, wherein the bonding area is provided with an input terminal group, a first output terminal group and a second output terminal a group; the first output terminal group is located at a side of the input terminal group away from the active area, and the second output terminal group is located between the first output terminal group and the input terminal group; when bonding chips, the first output terminal group or the second output terminal group is selected to cooperate with the input terminal group for chip bonding according to the chip type. By simultaneously providing the first and second output terminal groups, the bonding of the second type chip increases the distance between the chip and the edge of the array substrate.

    Cell test method and cell test device

    公开(公告)号:US10354567B2

    公开(公告)日:2019-07-16

    申请号:US15320764

    申请日:2016-07-11

    Abstract: A cell test method used for a fanout zone of a step location of a liquid crystal displays panel or an organic light emitting display panel, comprising the following steps: adding a cell test pad on an edge of a semi-finished flexible printed circuit board on glass (FOG) for the cell test method if length of the edge of the semi-finished FOG is greater than a critical value; placing alignment marks on the cell test pad; aligning the cell test pad by using the charge-coupled device; multiplexing process of some pins of the flexible printed circuit board to send signals for a cell test if the length of an edge of the semi-finished FOG is less than the critical value, controlling the signals to turn on by a metal oxide semiconductor.

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