Invention Grant
- Patent Title: Cell test method and cell test device
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Application No.: US15320764Application Date: 2016-07-11
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Publication No.: US10354567B2Publication Date: 2019-07-16
- Inventor: Bin Xiong , Yingchi Wang , Chunhung Huang
- Applicant: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Hubei
- Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Hubei
- Agent Mark M. Friedman
- International Application: PCT/CN2016/089627 WO 20160711
- International Announcement: WO2017/161781 WO 20170928
- Main IPC: G09G3/00
- IPC: G09G3/00 ; H01L21/66 ; G02F1/133 ; G01R31/00 ; G02F1/13 ; G02F1/1333 ; G06F3/041 ; G09G3/36 ; G09G3/3225

Abstract:
A cell test method used for a fanout zone of a step location of a liquid crystal displays panel or an organic light emitting display panel, comprising the following steps: adding a cell test pad on an edge of a semi-finished flexible printed circuit board on glass (FOG) for the cell test method if length of the edge of the semi-finished FOG is greater than a critical value; placing alignment marks on the cell test pad; aligning the cell test pad by using the charge-coupled device; multiplexing process of some pins of the flexible printed circuit board to send signals for a cell test if the length of an edge of the semi-finished FOG is less than the critical value, controlling the signals to turn on by a metal oxide semiconductor.
Public/Granted literature
- US20180061289A1 CELL TEST METHOD AND CELL TEST DEVICE Public/Granted day:2018-03-01
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