公开(公告)号：US09597052B2

公开(公告)日：2017-03-21

申请号：US14314775

申请日：2014-06-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sang-min Lee ,  Sung-kyu Park ,  Min-kook Cho ,  Ji-hoon Kang ,  Jin-hwan Oh ,  Jerome Crocco

IPC: A61B6/00

CPC classification number: A61B6/563 ,  A61B6/4233 ,  A61B6/488 ,  A61B6/544 ,  A61B6/566

Abstract: A method for storing X-ray data includes acquiring the X-ray data by using an X-ray detection module; and transmitting all or some of the acquired X-ray data to other X-ray detection module which is different from the X-ray detection module that has acquired the X-ray data.

公开(公告)号：US10307117B2

公开(公告)日：2019-06-04

申请号：US15142702

申请日：2016-04-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung-kyu Park ,  Dae-yeong Jang ,  Key-jo Hong ,  Hee-cheol Kim ,  Jeong-geun Cho

IPC: A61B6/00 ,  G01T1/24 ,  A61B6/03

Abstract: Provided are an X-ray detecting apparatus which is capable of controlling an electric power supplied to an X-ray detector module while an X-ray tomography scanning is being performed, and a method for operating the X-ray detecting apparatus. The X-ray detecting apparatus includes an X-ray detector module which has a heat dissipation structure.

公开(公告)号：US11036577B2

公开(公告)日：2021-06-15

申请号：US16407881

申请日：2019-05-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Beom-kyu Shin ,  Sung-kyu Park

IPC: G06F11/10 ,  G06F3/06 ,  G06F11/30

Abstract: Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.

公开(公告)号：US11630724B2

公开(公告)日：2023-04-18

申请号：US17318643

申请日：2021-05-12

Applicant: Samsung Electronics Co., Ltd.

Inventor： Beom-kyu Shin ,  Sung-kyu Park

IPC: G06F11/10 ,  G06F3/06 ,  G06F11/30

Abstract: Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.

公开(公告)号：US09429664B2

公开(公告)日：2016-08-30

申请号：US14462928

申请日：2014-08-19

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jerome Crocco ,  Ji-hoon Kang ,  Sung-kyu Park ,  Jin-hwan Oh ,  Sang-min Lee ,  Min-kook Cho

IPC: G01T1/24 ,  H01L27/146 ,  H01L31/08 ,  G01N23/04 ,  G01T7/00

CPC classification number: G01T1/24 ,  G01N23/04 ,  G01T7/00 ,  H01L27/14676 ,  H01L27/14696 ,  H01L31/085

Abstract: An X-ray detector and an X-ray imaging apparatus including the X-ray detector are provided. The X-ray detector includes a detector element including a cathode electrode and an anode electrode which are spaced apart from each other and a photoconductive layer located between the cathode electrode and the anode electrode and configured to absorb X-rays and generate electric charges, a first temperature controller configured to contact a first surface of the detector element and is configured to control a temperature of the cathode electrode, and a second temperature controller configured to contact a second surface of the detector element opposite to the first surface of the detector element and configured to control a temperature of the anode electrode.

Abstract translation: 提供了包括X射线检测器的X射线检测器和X射线摄像装置。 X射线检测器包括：检测器元件，其包括彼此间隔开的阴极电极和阳极电极，以及位于阴极电极和阳极电极之间并被构造成吸收X射线并产生电荷的光电导层， 第一温度控制器被配置为接触检测器元件的第一表面并且被配置为控制阴极电极的温度;以及第二温度控制器，被配置为接触与检测器元件的第一表面相对的检测器元件的第二表面，以及 被配置为控制阳极电极的温度。