Invention Grant
- Patent Title: Memory controller including ECC circuit, memory system having the same, and method of operating memory system and memory controller
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Application No.: US17318643Application Date: 2021-05-12
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Publication No.: US11630724B2Publication Date: 2023-04-18
- Inventor: Beom-kyu Shin , Sung-kyu Park
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2018-0139398 20181113
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F3/06 ; G06F11/30

Abstract:
Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.
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