公开(公告)号：US20240380875A1

公开(公告)日：2024-11-14

申请号：US18643364

申请日：2024-04-23

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jisu RYU ,  Jinki KIM ,  Myounggyo SEO ,  Changrim YU ,  Jina JEON

IPC: H04N13/366 ,  G06V40/16 ,  H04N13/243 ,  H04N13/296 ,  H04N23/16 ,  H04N23/72 ,  H04N23/73 ,  H04N23/74 ,  H04N23/90

Abstract: A wearable electronic device is provided. The wearable electronic device includes a processor and memory communicatively coupled to the processor. The wearable electronic device includes a first tracking device including first lights corresponding to a first area of a user wearing the wearable electronic device and first cameras corresponding to the first area, and a second tracking device including second lights corresponding to a second area of the user and second cameras corresponding to the second area. The memory store one or more computer programs including computer-executable instructions that, when executed by the processor, cause the wearable electronic device to generate a first signal related to the exposure of a first primary camera among the first cameras before an exposure time of the first primary camera and input the generated first signal as a signal notifying the second cameras of the start of a frame.

公开(公告)号：US20220263326A1

公开(公告)日：2022-08-18

申请号：US17671935

申请日：2022-02-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jisu RYU

IPC: H02J7/00 ,  H02J50/12 ,  G01R31/3835

Abstract: According to certain embodiments, an electronic device comprises: a rechargeable battery configured to supply power to the electronic device; a processor connected to the battery; and memory storing a plurality of executable instructions, wherein the execution of the executable instructions by the processor causes performing a plurality of operations, wherein the plurality of operations comprises: charging the battery based on a target voltage level, wherein the target voltage level is based on a number of times the rechargeable battery has been previously charged, detecting that the voltage of the rechargeable battery is maintained within a range of levels lower than the target level, and protecting the battery in response to detecting.

公开(公告)号：US20250014301A1

公开(公告)日：2025-01-09

申请号：US18663581

申请日：2024-05-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jisu RYU

IPC: G06V10/141 ,  G06T7/20 ,  G06V40/18 ,  G06V40/19 ,  H04N23/56 ,  H04N23/90

Abstract: A wearable device is provided. The wearable device includes a plurality of light sources configured to emit light toward an eye of a user wearing the wearable device. The wearable device includes a camera configured to capture images of at least a part of the eye of the user wearing the wearable device. The wearable device includes at least one processor comprising processing circuitry. The wearable device includes memory, comprising one or more storage mediums, storing instructions. The wearable device performs eye tracking based on the images captured by the camera while the plurality of the light sources are controlled to emit light toward the eye of the user. The wearable device performs iris recognition based on at least one image captured by the camera while a portion of the plurality of the light sources is controlled to emit light toward the eye of the user and a remaining portion of the plurality of the light sources is deactivated.

公开(公告)号：US20220026494A1

公开(公告)日：2022-01-27

申请号：US17309295

申请日：2019-11-18

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sengtai LEE ,  Daejin KWAK ,  Jisu RYU ,  Yonghyun PARK ,  Jinhyuk CHOI ,  Yonghwan HYUN

IPC: G01R31/3835 ,  H02J7/00 ,  G01R31/392

Abstract: Various embodiments of the present invention relate to an electronic device for diagnosing a battery, and the electronic device may include a battery; and a power management module operatively connected with the battery, and including a charging circuit which controls charge of the battery, wherein the power management module is configured to monitor a charge state of the battery, if the battery reaches a first designated state, identify a time taken to change from the first designated state to a second designated state, and determine whether the battery is abnormal, based at least in part on the identified time. Other various embodiments are possible.

公开(公告)号：US20230062165A1

公开(公告)日：2023-03-02

申请号：US17895604

申请日：2022-08-25

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jisu RYU ,  Sengtai LEE

IPC: H02J50/60 ,  H02J50/10 ,  H02J50/80 ,  H02J7/00

Abstract: An electronic device is provided. The electronic device includes a power receiver including a power receiving coil, a battery, and at least one processor operatively connected to the power receiver and the battery, wherein the at least one processor may be configured to identify whether a wireless charging protection mode has been entered, to wirelessly receive power in a first range from the power transmitting device through the power receiver when it is identified that a wireless charging protection mode has not been entered, to charge the battery using power in the first range, to identify a charge amount of the battery charged for a designated time, and to identify that a metallic foreign object exists, and to change the heat generation control condition in case it is identified that the charge amount of the battery is less than a designated value.

公开(公告)号：US20200175665A1

公开(公告)日：2020-06-04

申请号：US16599733

申请日：2019-10-11

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Min-Chul PARK ,  Ami MA ,  Jisu RYU ,  Changwook JEONG

IPC: G06T7/00 ,  H01L21/67 ,  G01N21/956 ,  G06T5/00 ,  G01N21/95

Abstract: A semiconductor wafer fault analysis system includes: a database to store a first reference map, which is classified as a first fault type, and a second reference map, which is classified as a second fault type; a first auto-encoder/decoder to remove a noise corresponding to the first fault type from the first reference map to generate a first pre-processed reference map; a second auto-encoder/decoder to remove a noise corresponding to the second fault type from the second reference map to generate a second pre-processed reference map; and a fault type analyzer. The database is updated based on the first and second pre-processed reference maps, and the fault type analyzer is to classify a fault type of a target map based on the updated database. The target map is generated by measuring a target wafer.

公开(公告)号：US20190385695A1

公开(公告)日：2019-12-19

申请号：US16249543

申请日：2019-01-16

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Changwook JEONG ,  Sanghoon MYUNG ,  Min-Chul PARK ,  Jeonghoon KO ,  Jisu RYU ,  Hyunjae JANG ,  Hyungtae KIM ,  Yunrong LI ,  Min Chul JEON

IPC: G11C29/50 ,  G11C29/48 ,  G11C29/56 ,  G01R31/27 ,  G01R31/26 ,  G01R31/3185 ,  G01R31/30

Abstract: A fault analysis method of a semiconductor fault analysis device is provided. The fault analysis method includes: receiving measurement data measured corresponding to a semiconductor device; generating double sampling data based on the measurement data and reference data; performing a fault analysis operation with respect to the double sampling data; classifying a fault type of the semiconductor device based on a result of the fault analysis operation; and outputting information about the fault type.