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公开(公告)号:US20160033860A1
公开(公告)日:2016-02-04
申请号:US14775249
申请日:2014-03-04
Applicant: ASML NETHERLANDS B.V.
Inventor: James Norman WILEY , Juan Diego ARIAS ESPINOZA , Derk Servatius Gertruda BROUNS , Laurentius Cornelius DE WINTER , Florian Didier Albin DHALLUIN , Pedro Julian RIZO DIAGO , Luigi SCACCABAROZZI
IPC: G03F1/64
CPC classification number: G03F1/64 , G03F1/62 , G03F7/70908 , G03F7/70983
Abstract: The present invention is concerned with an apparatus for shielding a reticle for EUV lithography. The apparatus comprises a pellicle, and at least one actuator in communication with the pellicle, the actuator being configured to induce, in use, movement of the pellicle with respect to a reticle.
Abstract translation: 本发明涉及用于屏蔽用于EUV光刻的掩模版的装置。 该装置包括防护薄膜组件和至少一个与防护薄膜组件连通的致动器,所述致动器构造成在使用中诱导防护薄膜相对于掩模版的运动。
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2.
公开(公告)号:US20190146332A1
公开(公告)日:2019-05-16
申请号:US16247179
申请日:2019-01-14
Applicant: ASML Netherlands B.V.
Inventor: Pieter-Jan VAN ZWOL , Vadim Yevgenyevich BANINE , Jozef Petrus Henricus BENSCHOP , Florian Didier Albin DHALLUIN , Mária PÉTER , Luigi SCACCABAROZZI , Willem Joan VAN DER ZANDE
Abstract: A membrane transmissive to EUV radiation, which may be used as a pellicle or spectral filter in a lithographic apparatus. The membrane has one or more high doped regions wherein the membrane is doped with a dopant concentration greater than 1017 cm−3, and one or more regions with low (or no) doping. The membrane may have a main substrate having low doping and one or more additional layers, wherein the high doped regions are within some or all of the additional layers.
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公开(公告)号:US20180246414A1
公开(公告)日:2018-08-30
申请号:US15753811
申请日:2016-08-02
Applicant: ASML Netherlands B.V.
Inventor: Vadim Yevgenyevich BANINE , Han-Kwang NIENHUYS , Luigi SCACCABAROZZI
Abstract: Disclosed is a suppression filter having a profile defining at least two reflective surface levels, each reflected surface level being separated by a separation distance. The separation distance is such that the reflective suppression filter is operable to substantially prevent specular reflection of radiation at a first wavelength and at a second wavelength incident on said reflective suppression filter. Also disclosed is a radiation collector, radiation source and lithographic apparatus comprising such a suppression filter, and to a method of determining a separation distance between at least two reflective surface levels of a suppression filter.
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4.
公开(公告)号:US20170205704A1
公开(公告)日:2017-07-20
申请号:US15320749
申请日:2015-07-02
Applicant: ASML Netherlands B.V.
Inventor: Andrey Alexandrovich NIKIPELOV , Vadim Yevgenyevich BANINE , Jozef Petrus Henricus BENSCHOP , Arjen BOOGAARD , Florian Didier Albin DHALLUIN , Alexey Sergeevich KUZNETSOV , Mária PÉTER , Luigi SCACCABAROZZI , Willem Joan VAN DER ZANDE , Pieter-Jan VAN ZWOL , Andrei Mikhailovich YAKUNIN
CPC classification number: G03F1/62 , G02B5/1838 , G02B5/208 , G03F1/24 , G03F1/38 , G03F7/70191 , G03F7/70316 , G03F7/70575 , G03F7/70891 , G03F7/70916 , G03F7/70958 , G03F7/70983
Abstract: A membrane transmissive to EUV radiation, which may be used as a pellicle or spectral filter in a lithographic apparatus. The membrane includes one or more high doped regions wherein the membrane is doped with a dopant concentration greater than 1017 cm−3, and one or more regions with low (or no) doping. The membrane may have a main substrate having low doping and one or more additional layers, wherein the high doped regions are comprised within some or all of the additional layers.
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