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公开(公告)号:CN101038891B
公开(公告)日:2010-08-25
申请号:CN200710088339.1
申请日:2007-03-16
Applicant: 株式会社东芝
CPC classification number: H01L21/78 , B28D5/022 , H01L21/67132 , H01L21/6835 , H01L24/27 , H01L24/32 , H01L24/48 , H01L24/73 , H01L24/83 , H01L24/85 , H01L25/0657 , H01L2224/274 , H01L2224/2919 , H01L2224/32145 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/73265 , H01L2224/83191 , H01L2224/8385 , H01L2224/85 , H01L2225/0651 , H01L2225/06575 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01029 , H01L2924/01033 , H01L2924/01082 , H01L2924/014 , H01L2924/0665 , H01L2924/07802 , H01L2924/09701 , H01L2924/15311 , H01L2924/15788 , H01L2924/181 , H01L2924/00 , H01L2924/3512 , H01L2924/00012 , H01L2224/45099 , H01L2224/45015 , H01L2924/2075 , H01L2924/20751 , H01L2924/20752
Abstract: 在半导体晶片的背面层叠厚度超过25μm的粘接剂层和切割带。使用切入深度到达粘接剂层的第1刀具,一起切割半导体晶片和粘接剂层的一部分。使用切入深度到达切割带而且宽度小于第1刀具的第2刀具,一起切割粘接剂层和切割带的一部分。从切割带上拾取和粘接剂层一起将半导体晶片切割为单体的半导体元件,并粘接在其他半导体元件、电路基体材料等上。
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公开(公告)号:CN101038891A
公开(公告)日:2007-09-19
申请号:CN200710088339.1
申请日:2007-03-16
Applicant: 株式会社东芝
CPC classification number: H01L21/78 , B28D5/022 , H01L21/67132 , H01L21/6835 , H01L24/27 , H01L24/32 , H01L24/48 , H01L24/73 , H01L24/83 , H01L24/85 , H01L25/0657 , H01L2224/274 , H01L2224/2919 , H01L2224/32145 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/73265 , H01L2224/83191 , H01L2224/8385 , H01L2224/85 , H01L2225/0651 , H01L2225/06575 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01029 , H01L2924/01033 , H01L2924/01082 , H01L2924/014 , H01L2924/0665 , H01L2924/07802 , H01L2924/09701 , H01L2924/15311 , H01L2924/15788 , H01L2924/181 , H01L2924/00 , H01L2924/3512 , H01L2924/00012 , H01L2224/45099 , H01L2224/45015 , H01L2924/2075 , H01L2924/20751 , H01L2924/20752
Abstract: 在半导体晶片的背面层叠厚度超过25μm的粘接剂层和切割带。使用切入深度到达粘接剂层的第1刀具,一起切割半导体晶片和粘接剂层的一部分。使用切入深度到达切割带而且宽度小于第1刀具的第2刀具,一起切割粘接剂层和切割带的一部分。从切割带上拾取和粘接剂层一起将半导体晶片切割为单体的半导体元件,并粘接在其他半导体元件、电路基体材料等上。
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