Invention Grant
- Patent Title: Carbon based contact structure for silicon carbide device technical field
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Application No.: US15136121Application Date: 2016-04-22
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Publication No.: US09917170B2Publication Date: 2018-03-13
- Inventor: Ravi Joshi , Romain Esteve , Markus Kahn , Gerald Unegg
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L21/28
- IPC: H01L21/28 ; H01L21/44 ; H01L29/45 ; H01L29/16 ; H01L21/04 ; H01L21/265 ; H01L21/324

Abstract:
A method of forming a contact structure includes providing a silicon-carbide substrate having a highly doped silicon-carbide contact region formed in the substrate and extending to a main surface of the substrate. A carbon-based contact region is formed which is in direct contact with the highly doped silicon-carbide contact region and which extends to the main surface. A conductor is formed on the carbon-based contact region such that the carbon-based contact region is interposed between the conductor and the highly doped silicon-carbide contact region. A thermal budget for forming the carbon-based contact region is maintained below a level that induces metal silicidization of the highly doped silicon-carbide contact region.
Public/Granted literature
- US20170309720A1 Carbon Based Contact Structure for Silicon Carbide Device Technical Field Public/Granted day:2017-10-26
Information query
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