- 专利标题: Silicide structures in transistors and methods of forming
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申请号: US17826673申请日: 2022-05-27
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公开(公告)号: US11855169B2公开(公告)日: 2023-12-26
- 发明人: Kai-Di Tzeng , Chen-Ming Lee , Fu-Kai Yang , Mei-Yun Wang
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Slater Matsil, LLP
- 分案原申请号: US16881384 2020.05.22
- 主分类号: H01L29/45
- IPC分类号: H01L29/45 ; H01L29/78 ; H01L29/417 ; H01L21/8238 ; H01L27/092 ; H01L29/40
摘要:
A device includes a gate stack; a gate spacer on a sidewall of the gate stack; a source/drain region adjacent the gate stack; a silicide; and a source/drain contact electrically connected to the source/drain region through the silicide. The silicide includes a conformal first portion in the source/drain region, the conformal first portion comprising a metal and silicon; and a conformal second portion over the conformal first portion, the conformal second portion further disposed on a sidewall of the gate spacer, the conformal second portion comprising the metal, silicon, and nitrogen.
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