Invention Grant
- Patent Title: Method of writing to memory circuit using resistive device
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Application No.: US15864873Application Date: 2018-01-08
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Publication No.: US10373964B2Publication Date: 2019-08-06
- Inventor: Yen-Huei Chen , Hung-Jen Liao , Chih-Yu Lin , Jonathan Tsung-Yung Chang , Wei-Cheng Wu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Hauptman Ham, LLP
- Main IPC: G11C11/00
- IPC: G11C11/00 ; H01L27/11 ; G11C11/412 ; G11C11/419 ; H01L23/522 ; H01L23/528 ; H01L23/532 ; H01L49/02 ; G11C5/02 ; G11C5/14

Abstract:
A method, of writing to a memory cell, includes: causing a pulling device of the memory cell to pull a voltage level at a first data node of the memory cell toward a first supply voltage level responsive to a voltage level at a second data node of the memory cell; causing a pass gate of the memory cell to pull the voltage level at the first data node of the memory cell toward a second supply voltage level responsive to a word line signal, the second supply voltage level being different from the first supply voltage level; and limiting a driving capability of the pulling device by a resistive device, the resistive device being electrically coupled between the pulling device and a supply voltage source configured to provide a first supply voltage, the first supply voltage having the first supply voltage level.
Public/Granted literature
- US20180130809A1 METHOD OF WRITING TO MEMORY CIRCUIT USING RESISTIVE DEVICE Public/Granted day:2018-05-10
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