- 专利标题: Method for silicide formation
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申请号: US15860317申请日: 2018-01-02
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公开(公告)号: US10263088B2公开(公告)日: 2019-04-16
- 发明人: Yu-Hung Lin , Sheng-Hsuan Lin , Chih-Wei Chang , You-Hua Chou , Chia-Lin Hsu
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater Matsil, LLP
- 主分类号: H01L29/417
- IPC分类号: H01L29/417 ; H01L21/285 ; H01L29/66 ; H01L23/485 ; H01L23/532 ; H01L21/768 ; H01L29/78 ; H01L21/3205 ; H01L21/02
摘要:
Embodiments of the present disclosure include contact structures and methods of forming the same. An embodiment is a method of forming a semiconductor device, the method including forming a contact region over a substrate, forming a dielectric layer over the contact region and the substrate, and forming an opening through the dielectric layer to expose a portion of the contact region. The method further includes forming a metal-silicide layer on the exposed portion of the contact region and along sidewalls of the opening; and filling the opening with a conductive material to form a conductive plug in the dielectric layer, the conductive plug being electrically coupled to the contact region.
公开/授权文献
- US20180145140A1 Method for Silicide Formation 公开/授权日:2018-05-24
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