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公开(公告)号：US20240133926A1
公开(公告)日：2024-04-25
申请号：US18546727
申请日：2022-02-14
发明人： Jeong Bok Lee , Dong Choon Kim , Dong Hwa Kim
CPC分类号： G01R19/15 , G01R1/04 , G01R1/203 , G01R1/30 , G01R15/202
摘要： The present invention relates to a current sensing device comprising: a bus bar including a plurality of low-resistance metal portions separated from each other with a resistance portion therebetween; a printed circuit board arranged below the bus bar; a plurality of fixing pins which are joined to the metal portions of the bus bar to fix the bus bar on the printed circuit board and provide a current path between the metal portions and the printed circuit board; and at least one Hall sensor module. At least a portion of the Hall sensor module is inserted into a sensor hole formed in at least one of the low-resistance metal portions of the bus bar.
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公开(公告)号：US20240053385A1
公开(公告)日：2024-02-15
申请号：US18088945
申请日：2022-12-27
发明人： Qichao ZHAO , Ran Yang , Zhao Li
摘要： Disclosed are an EEG impedance test circuit, a method, and a device. The circuit comprises a frequency selecting circuit, an amplification circuit, a follower circuit, and a power supply terminal AVCC. An input end of the frequency selecting circuit is connected to the power supply terminal AVCC, the input end of the frequency selecting circuit is further connected to the input end of the amplification circuit, an output end of the frequency selecting circuit is connected to the output end of the amplification circuit, and the output end of the amplification circuit is connected to the input end of the follower circuit; the frequency selecting circuit is configured for oscillating so as to generate an oscillation signal; and the follower circuit is configured for isolating the frequency selecting circuit and the amplification circuit; the follower circuit is configured for circuit isolation.
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公开(公告)号：US20240027496A1
公开(公告)日：2024-01-25
申请号：US18256744
申请日：2021-12-03
发明人： Kazuaki HANEDA
CPC分类号： G01R1/30 , H03F3/45475 , H03F2200/129 , H03F2203/45526
摘要： An amplifier circuit includes an operational amplifier to amplify an input signal input to a non-inverting input terminal, first and second feedback units to feed back an output signal output from the operational amplifier to an inverting input terminal of the operational amplifier, and a coupling unit to AC couple the second feedback unit and the inverting input terminal. The first feedback unit is to, together with the coupling unit, as a frequency of the output signal of the operational amplifier is increased, reduce an electric potential to be applied to the inverting input terminal with respect to the output signal. At the same time, the second feedback unit is to generate a predetermined electric potential lower than an electric potential of the output signal, the second feedback unit being configured to apply a predetermined electric potential to the inverting input terminal via the coupling unit.
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公开(公告)号：US11828780B1
公开(公告)日：2023-11-28
申请号：US17354274
申请日：2021-06-22
申请人： ZT Group Int'l, Inc.
发明人： Yung-Tsung Hsieh , Chi-Lin Chiu
CPC分类号： G01R27/2605 , G01D5/24 , G01R1/30
摘要： Systems and methods are described for reporting capacitance of a capacitor of a power backup circuit comprising a plurality of metal-oxide-semiconductor field-effect transistors (MOSFETs). The system may also include a bleeder resistor and a voltage detection circuit. When capacitance monitoring is active, a first MOSFET may be turned off, causing the capacitor to be discharged via the bleeder resistor. After predetermined time intervals, a first drain voltage and a second drain voltage of the first MOSFET may be determined using the voltage detection circuit. The drain voltage readings at the different times may be used to determine the capacitance of the capacitor, which may be used to generate and transmit a report on capacitor performance and status.
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公开(公告)号：US11768231B1
公开(公告)日：2023-09-26
申请号：US18198460
申请日：2023-05-17
IPC分类号： G01R1/30 , G01R19/00 , C12Q1/6869 , G01R19/165
CPC分类号： G01R19/003 , C12Q1/6869 , G01R19/16504
摘要： This application provides a current measurement circuit including: an amplification unit, configured to amplify an electrical signal from the sensor unit; a comparison unit, configured to obtain an initial pulse signal based on a voltage signal output by the amplification unit and a preset voltage; a delay unit, electrically connected to the comparison unit and configured to delay an output of the initial pulse signal to obtain a target pulse signal; a resistance unit, wherein two terminals of the resistance unit are electrically connected to an input terminal of the amplification unit and an output terminal of the delay unit respectively, and the resistance unit is configured to charge and discharge the amplification unit based on the target pulse signal; and a calculation unit, electrically connected to the delay unit and configured to calculate a target current based on the target pulse signal output by the delay unit.
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公开(公告)号：US11428715B2
公开(公告)日：2022-08-30
申请号：US16640127
申请日：2018-07-20
申请人： KOA CORPORATION
发明人： Tamotsu Endo
摘要： A current measurement device comprising: a shunt resistor; a pair of first and second voltage signal lines connected to the shunt resistor; and a current measurement circuit for measuring a current using a signal by the pair of first and second voltage signal lines. The pair of first and second voltage signal lines are connected to an amplifier circuit with which the current measurement circuit is provided to amplify a voltage signal. A third signal line which is a signal line different from the pair of first and second voltage signal lines and drawn from the shunt resistor is connected to a common line of the current measurement circuit.
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公开(公告)号：US11193957B2
公开(公告)日：2021-12-07
申请号：US16539404
申请日：2019-08-13
发明人： Hio Leong Chao
IPC分类号： G01R15/14 , G01R1/30 , H01L23/528 , H01L23/522 , H03F3/45 , G01R19/25
摘要： Techniques for improving current sensing via a shunt resistance are provided. In an example, an apparatus for sensing current can include a substrate, and a plurality of metal layers stacked on the substrate and separated from the substrate and from each other by an insulation material. In certain examples, a first one or more metal layers can form a sense resistance configured to pass current between a source and a load, and a second one or more metal layers can form one or more gain resistances coupled to the sense resistance and configured to couple to a current sense amplifier. In some example, a metal layer can include portions of both the sense resistance and the gain resistance to compensate for environmental anomalies, material anomalies or manufacturing anomalies.
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公开(公告)号：US11163012B2
公开(公告)日：2021-11-02
申请号：US16273430
申请日：2019-02-12
发明人： Ryo Iida
摘要： An energization evaluation test equipment for an input filter of a large capacity PWM converter by reducing the power supply capacity to the equipment under test is provided. The energization evaluation test is equivalent to an actual load test. An equipment under test has an input filter connected to an output terminal of an AC power source and a PWM converter connected to an output terminal of the input filter to convert an AC power source to a DC power source. The evaluation test equipment includes a PWM converter input filter and a PWM converter configured similarly to the PWM converter input filter and the PWM converter of the equipment under test, respectively, a direct current reactor connected to an output terminal of a PWM converter of the equipment under test, a PWM controller for controlling the PWM converter of the equipment under test and controlling the PWM converter of the energization evaluation test equipment, wherein, outputs of the PWM converter of the equipment under test and the PWM converter of the energization evaluation test equipment are connected in series via the direct current reactor, and the PWM controller is performed so that the output voltage of the PWM converter of the equipment under test becomes a desired value and the output current of the PWM converter of the energization evaluation test equipment becomes a desired value.
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公开(公告)号：US20210328583A1
公开(公告)日：2021-10-21
申请号：US17356915
申请日：2021-06-24
发明人： Olivier MELINE , François GUILLOT
IPC分类号： H03K17/082 , G01R1/20 , G01R1/30
摘要： A switching circuit comprising a transistor (23) and a drive component both for controlling the transistor and also for limiting the power supply current (Ia) suppled to a load (22), the drive component being arranged both to receive a control voltage (VH) and also: when the control voltage (VH) is disconnection signal, to generate a drive voltage (VP) that causes the transistor to occupy a non-conductive state; when the control voltage (VH) is a connection signal and the power supply current (Ia) cannot reach a predefined current threshold, to generate drive voltage (VP) that causes the transistor to occupy saturated conditions; and when the control voltage (VH) is a connection signal and the power supply current (Ia) can reach a predefined current threshold, to generate a drive voltage (VP) that causes the transistor to occupy linear conditions, such that the power supply current is regulated so that it does not exceed the predefined current threshold.
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公开(公告)号：US20210231749A1
公开(公告)日：2021-07-29
申请号：US17226574
申请日：2021-04-09
申请人： DISH Network L.L.C.
发明人： Rodney Davis , Jamie Metzger , Ken Jones
摘要： Devices, systems, and processes for testing capacitors are disclosed. A system includes a digital signal processor configured to execute non-transient computer executable instructions for testing a device over at least three operating modes. The operating modes may include a start-up mode, during which the digital signal processor is configured to control initial charging of the device to a desired initial condition, a charge mode, during which the digital signal processor is configured to control replenishment of electrical energy in the device, and a test mode, during which the digital signal processor is configured to control testing of the device in accordance with at least one testing protocol. The device may include an energy capture circuit configured to capture recovered energy arising during a first test cycle and to provide the recovered energy to the device for use during a second test cycle.
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