Devices, systems, and processes for testing capacitors are disclosed. A system includes a digital signal processor configured to execute non-transient computer executable instructions for testing a device over at least three operating modes. The operating modes may include a start-up mode, during which the digital signal processor is configured to control initial charging of the device to a desired initial condition, a charge mode, during which the digital signal processor is configured to control replenishment of electrical energy in the device, and a test mode, during which the digital signal processor is configured to control testing of the device in accordance with at least one testing protocol. The device may include an energy capture circuit configured to capture recovered energy arising during a first test cycle and to provide the recovered energy to the device for use during a second test cycle.