• 专利标题: AMPLIFIER CIRCUIT AND MEASUREMENT APPARATUS
  • 申请号: US18256744
    申请日: 2021-12-03
  • 公开(公告)号: US20240027496A1
    公开(公告)日: 2024-01-25
  • 发明人: Kazuaki HANEDA
  • 申请人: HIOKI E.E. CORPORATION
  • 申请人地址: JP Ueda-shi, Nagano
  • 专利权人: HIOKI E.E. CORPORATION
  • 当前专利权人: HIOKI E.E. CORPORATION
  • 当前专利权人地址: JP Ueda-shi, Nagano
  • 优先权: JP 20206343 2020.12.11
  • 国际申请: PCT/JP2021/044410 2021.12.03
  • 进入国家日期: 2023-06-09
  • 主分类号: G01R1/30
  • IPC分类号: G01R1/30 H03F3/45
AMPLIFIER CIRCUIT AND MEASUREMENT APPARATUS
摘要:
An amplifier circuit includes an operational amplifier to amplify an input signal input to a non-inverting input terminal, first and second feedback units to feed back an output signal output from the operational amplifier to an inverting input terminal of the operational amplifier, and a coupling unit to AC couple the second feedback unit and the inverting input terminal. The first feedback unit is to, together with the coupling unit, as a frequency of the output signal of the operational amplifier is increased, reduce an electric potential to be applied to the inverting input terminal with respect to the output signal. At the same time, the second feedback unit is to generate a predetermined electric potential lower than an electric potential of the output signal, the second feedback unit being configured to apply a predetermined electric potential to the inverting input terminal via the coupling unit.
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