Abstract:
Disclosed are systems and methods for generating a beam of charged particles, such as an ion beam. Such a system may comprise an interaction chamber configured to support a target, one or more electromagnetic radiation sources, a sensor, and at least one processor. The one or more electromagnetic radiation sources may be configured to provide a probe beam at a first energy for determining orientation data of the target and a particle-generating beam at a second energy, which is greater than the first energy, for producing a beam of charged particles. The processor may be configured to receive feedback information from the sensor and to cause a change in a relative orientation between the particle-generating beam and the target.
Abstract:
A method for formatting ATM cells compliant with SPI-4 Phase 2 specification is presented. The method enables selection among various cell formats depending on the devices employed, and enables use of a payload-only test format, a typical format having payload and header data, a format having header error correction (HEC) data and dummy data, and a format having HEC data and user data.
Abstract:
The present invention provides a charged particle beam apparatus capable of preventing the charging-up of the specimen without using a large-scale facility. A scanning electron microscope 100 illuminates a specimen 21 with a charged particle beam via a charged particle optical system arranged in a column. According to the present invention, the scanning electron microscope 100 has a charge preventive member 110 disposed between the objective lens 14 and the specimen 21. The charge preventive member 110 has an electrically conductive portion and an opening 113 to transmit the charged particle beam. The charge preventive member 110 is formed so as to partly cover the charged particle optical system when viewed from the charged particle beam irradiation spot on the specimen. In addition, the charge preventive member 110 has gas inflow paths 114 and 115 formed therein. These gas inflow paths have gas injection outlets 116 formed to inject gas toward the charged particle beam irradiation spot on the specimen.
Abstract:
An electro-optical scanning device reads indicia having parts of different light reflectivity, including bar codes and matrix arrays such as UPSCODES. The scanning device includes laser or light emitting diodes for emitting at least two light beams of the same or different wavelengths. The light beams may be visible to the human eye, and the beams are optically directed to form one or two scan lines to scan portions of a symbol. Dual photosensor(s) or a charge coupled device detects light reflected from the different portions of the symbol. The charge coupled device can be used to detect either reflected ambient light or the reflected visible light from the beams emitted by the diodes. The photosensors generate signals corresponding to the detected light which can be processed simultaneously. The device is particularly useful in reading two dimensional or more complex symbols. Methods for reading indicia are also described.
Abstract:
An optical system for generating multiple linear images of an illuminated object line and focusing the image onto an image plane. The multiple images are generated on the object side of the lens using optical beam-splitting techniques. In a preferred embodiment, the images are converted into electrical signals after focusing onto photosensor arrays.
Abstract:
Apparatus for use in a radiation scanning system comprising a radiation detector and an optical system arranged to scan radiation from a field of view across the radiation detector. The optical system includes two sets of planar reflective surfaces, one set being movable relative to the other, and a rotary assembly carrying one of the sets and rotatable about an axis of rotation. The detector is arranged relative to the optical system such that the radiation enters the detector after sequential reflection from reflective surfaces of the two sets, and the surfaces which effect the sequential reflection being separated by a predetermined amount and being located with respect to the axis of rotation such that the angle of incidence of radiation at the detector is independent of the position of the radiation in the field of view.
Abstract:
1. A GLASS FOR LASER USE COMPRISING THE FOLLOWING COMPONENTS, IN PRESENT BY WEIGHT-40-90% OF METAPHOSPHATES SELECTED FROM THE GROUP CONSISTING OF LI, NA, K, ZN, CD, BA, PB, MG, CA, AND SR, 5-50% OF PHOSPHATES OF ELEMENTS SELECTED FROM THE GROUP CONSISTING OF AL, ZR, B, AND CE, 1-7% OF TRIVALENT NEODYMIUM ND3+, AND 0.3-5% OF TRIVALENT YTTERBIUM UB3+, SAID GLASS HAVING A THERMAL EXPANSION COEFFICIENT IN THE RANGE OF 50-160X10**-7 1/DEGREE, A MICROHARDNESS IN THE RANGE OF 300-450 KG./MM,2,A QUANTUM EFFICIENCY OF TRANSMISSION OF ND3+>YB3+HIGHER THAN 0.7, THE SECTION OF STIMULATED EMISSION OF YTTERBIUM AT X=1060 NM. BEING EQUAL TO ABOUT 2.5-5X10**-21 CM.2, AND A MAXIMUM INVERSION AT ELECTRIC ENERGY OF PUMPING OF 80 JOULES/CM.3 IS 1.5 TO 2X10**19 1/CM.2.
Abstract:
Apparatuses and systems for a die-integrated aspheric mirror are described herein. One apparatus includes an ion trap die including a number of ion locations and an aspheric mirror integrated with the ion trap die.
Abstract:
Apparatuses and systems for a die-integrated aspheric mirror are described herein. One apparatus includes an ion trap die including a number of ion locations and an aspheric mirror integrated with the ion trap die.