Abstract:
A magnetic head assembly includes a read head with a current perpendicular to the planes (CPP) sensor. The CPP sensor includes an AP pinned layer structure, a free layer and a spacer layer which is located between the free layer and the AP pinned layer structure. An in-stack longitudinal biasing structure for longitudinally biasing the free layer includes a pinned layer, an AFM pinning layer for pinning the pinned layer and a chromium spacer layer which is located between the pinned layer and the free layer. The free layer includes first and second free films with the first free film being iron and interfacing the spacer layer. The second free film may be nickel iron for imparting magnetic softness to the first free film. The pinned layer and a second AP pinned layer of the free layer structure may also be iron. The iron content of the layers in the sensor and the chromium spacer layer significantly increase the magnetoresistive coefficient dr/R of the CPP sensor.
Abstract:
A magnetic head of a magnetoresistance type is provided. The magnetic head comprises a magnetoresistance film, an underlying layer formed on each of both sides of the magnetoresistance film, and a magnetic-domain regulating film formed on the underlying layer so as to regulate a magnetic domain of a free magnetic layer in the magnetoresistance film. The underlying layer has a laminated structure of a tungsten-(W)-group metal layer formed on a tantalum-(Ta)-group metal layer. The underlying layer is formed so thick as to arrange the magnetic-domain regulating film at a position corresponding to the free magnetic layer.
Abstract:
A transducing head includes at least three magnetic layers. At least two of these magnetic layers function as shields of a reader portion of the transducing head, and at least one of these magnetic layers functions as a pole of a writer portion of the transducing head. Importantly, at least one of the three magnetic layers is formed of a thin film structure having a first and a second ferromagnetic layer, a nonmagnetic spacer layer, and a bias layer. The spacer layer is positioned between the first and the second ferromagnetic layers. The bias layer is positioned adjacent the first ferromagnetic layer. The second ferromagnetic layer has a thickness-magnetic moment product substantially equal to a thickness-magnetic moment product of the first ferromagnetic layer. An easy axis of the second ferromagnetic layer is substantially parallel to an easy axis of the first ferromagnetic layer.
Abstract:
A transducing head according to the present invention includes a pair of electrodes, a pair of biasing elements and a magnetoresistive sensor. The magnetoresistive sensor is positioned between the pair of electrodes. The magnetoresistive sensor includes a pair of flux guides and a free layer positioned substantially co-planar with and between the pair of flux guides. The pair of electrodes are for providing a sense current to the free layer in a direction substantially perpendicular to a plane of the free layer. The pair of biasing elements are positioned on opposing sides of the magnetoresistive sensor for providing longitudinal bias to the free layer.
Abstract:
A read head shield having improved stability includes a ferromagnetic (FM) layer and an anti-ferromagnetic (AFM) layer adjacent the FM layer. The FM layer has a patterned shape and a domain configuration that is defined by a plurality of local magnetic domains that are stabilized in accordance with the patterned shape. The AFM layer is annealed to imprint thereon the stabilized local magnetic domains of the FM layer. The AFM layer operates to increase the stability of the domain configuration of the FM layer thereby providing improved resistance to domain configuration shift caused by the application of a strong magnetic field.
Abstract:
A method and apparatus for a recording head using a spin-dependent tunneling (SDT) junction. The SDT junction utilizes an aluminum oxide tunnel barrier. The tunnel barrier can be formed to a thickness comparable with a typical Cu spacer layer on a spin valve. With the SDT junction, current is applied perpendicular to the plane of the film. The SDT junctions can have high magneto-resistance up to 40%. The magnetoresistive qualities of a head design incorporating the SDT junction are not directly related to head resistance, head geometry, bias current and film thickness. The method can include forming a spin tunnel barrier by fashioning a stack into a bottom electrode, defining a junction, depositing a layer of insulator, performing a photoprocess, depositing an upper electrode layer and lifting off the top electrode layer to define the electrode. The stack can include a pinned layer, a barrier layer and a free layer. The pinned layer can include NiFe. The barrier layer can include AlOx. The free layer can include Co. The junction can be defined with an ion mill and the insulator can include Al2O3. In addition, the top electrode layer can include Cu.
Abstract:
A magnetic head having a sensor with a free layer, a spacer layer coupled to the free layer, and a pinned layer coupled to the spacer layer. Each layer has an active portion defined between its end portions. Leads are coupled to the sensor, with each lead overlapping the end portions of the layers. The pinned layer is operative to substantially pin magnetic moments of the end portions of the free layer. The magnetic moment of the active portion of the pinned layer is oxidized to reduce its magnetic moment, allowing the magnetic moment of the active portion of the free layer to spin freely.
Abstract:
A spin valve sensor includes a free layer structure which is located between first and second spacer layers and the first and second spacer layers are located between first and second AP pinned layer structures. Each of the AP pinned layer structures has first and second AP pinned layers with the first AP pinned layer of the first AP pinned layer structure interfacing the first spacer layer and the first AP pinned layer of the second AP pinned layer structure interfacing the second spacer layer. The magnetic thickness of each of the first AP pinned layers is either greater or less than the magnetic thickness of either of the second AP pinned layers of the first and second AP pinned layer structures so that a magnetic field oriented perpendicular to an air bearing surface (ABS) of the sensor sets the magnetic moments of the first and second AP pinned layer structures in-phase so that changes in resistances of the sensor upon rotation of a magnetic moment of the free layer structure is additive.
Abstract:
There is provided a magnetoresistive head which can realize high sensitivity and low noise even when the reading track is being reduced. Longitudinal biasing is performed to a ferromagnetic free layer whose magnetization is rotated according to an external magnetic field by providing unidirectional magnetic anisotropy by exchange coupling to an antiferromagnetic layer. A hard magnetic film is arranged at the edge of a magnetoresistive film to reduce an effective reading track width.
Abstract:
A magnetoresistance effect device has the basic structure of substrate/sublayer/NiFe layer/CoFe layer/non-magnetic layer/fixed magnetic layer/antiferromagnetic layer. The sublayer may be Ta at a film thickness of not less than 0.2 nm but less than 3.0 nm, or Hf at a film thickness of not less than 0.2 nm but not greater than 1.5 nm, or Zr at a film thickness of not less than 0.2 nm but not greater than 2.5 nm. It is permissible to use only an NiFe layer instead of the NiFe layer/CoFe layer.