摘要:
A method for minimizing center frequency shift and linearity errors encountered in YIG filters, comprising the following steps: automatically generating data packages in test unit depending on the user request or containing all filter characteristic states and transmitting them to the driver circuit, adjusting the desired voltage level by means of the digital to analog converters contained in the structure of the data packages received by the driver circuit, and transmitting the adjusted voltage level to the YIG filter, measuring filter characteristics (scattering parameters) corresponding to the data packages transmitted to the YIG filter in the analyser, in order to calculate the center frequency shift of the filter, determining the center frequency and linearity calculations, and recording the characteristic features measured by the analyser in the test unit.
摘要:
A reference electrode assembly including an extension device having a first end opposite a second end and a fluid reservoir disposed between the first end and the second end, a reference electrode engageable with the extension device at the first end of the extension device, an end cap having an external electrical connector positioned at the second end of the extension device, a selectively actuatable spout fluidly coupled to the fluid reservoir, and a conductive wire extending through the fluid reservoir to electrically couple the reference electrode with the external electrical connector.
摘要:
A waveform data acquisition module acquires the waveforms of electrical signals for multiple channels. A memory controller continuously writes a digital signal S3 to one from among a first memory unit and a second memory unit. When a given memory unit has become full, the memory controller notifies an external higher-level controller that the corresponding memory unit is full and switches the wiring target to the other memory unit.
摘要:
The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method including: making a semiconductor device that is connected parallel to a load by a load cable, perform a switching operation; measuring common-mode current flowing through the load cable during the switching operation; and outputting an evaluation benchmark for radiated noise based on the common-mode current, and an evaluation apparatus are provided.
摘要:
Provided is a zero-crossing detection circuit capable of detecting zero-crossing with high accuracy without being influenced by noise. The zero-crossing detection circuit includes a first comparison circuit, a second comparison circuit having a hysteresis function, and a logic circuit. The first comparison circuit is configured to output a zero-crossing detection result of a first input signal and a second input signal. The second comparison circuit is configured to output a comparison result of the first input signal and the second input signal. The logic circuit includes a unit configured to determine whether to reflect the zero-crossing detection result to output of the logic circuit based on the zero-crossing detection result and the comparison result.
摘要:
Disclosed is a linearly moveable sliding contact element having a transport device. Linearly moveable sliding contact elements of this type having a transport device are required to electrically contact conductor paths of circuit boards with one another, the circuit boards being oriented in parallel with one another and arranged above one another. In addition, the sliding contact element is arranged on a spindle of the transport device having an outer thread. Via a rotation of the transport device, the sliding contact element can be moved in a linear manner along the spindle by the outer thread. A first bearing and a second bearing are provided at the ends of the spindle. The bearings permit a mounting of the transport device between two circuit boards arranged in parallel with one another.
摘要:
An integrated circuit includes a Built-In Self-Test (BIST) circuit, a predetermined signature pattern and a Read Only Memory (ROM), wherein the predetermined signature pattern is stored in the integrated circuit. The ROM stores at least effective information and a BIST signature adjustment code, the BIST signature adjustment code is irrelevant to any functional information stored in the ROM; wherein the BIST circuit is used to test content stored in the ROM to generate a signature pattern, and compare the signature pattern with the predetermined signature pattern to judge if the content stored in the ROM has error.
摘要:
A method and a system for terahertz detection, using at least a first and a second electrodes separated by a centro-symmetric material. The system comprises at least a first and a second electrodes with conductive pads for connection to a voltage source, separated by a centro-symmetric material; the method comprising second harmonic generation in the centro-symmetric material by overlapping of a probe and a terahertz beams.
摘要:
The invention relates to a method and to a switching device (4) and a measurement system (1). In the method according to the invention for determining time differences between measurement signals measured by at least two couple measurement devices (2, 3), a time basis signal is first generated for the measurement devices (2, 3). A common reference signal is further generated by a signal generator (5). The common reference signal is fed to measurement signal inputs (8, 9) of the coupled measuring devices (2, 3) via the switching device (4). A measurement signal is then fed to said measurement signal inputs (8, 9) of the coupled measuring devices (2, 3) and the time position of the measurement signals relative to the reference signal is determined in each of the coupled measuring devices (2, 3). The switching device (4), to this end, has a first measuring device connection (12) and a second measuring device connection (13) connected to the measurement signal inputs (8, 9) of the first measuring device (2) and the second measuring device (3). A reference signal is alternately fed via the measuring device connections (12, 13) of the switching device (4) to the first or the second measuring device (2, 3) by connecting the first measuring device connection (12) to the reference signal input (22) or a first measuring connection (14), or by connecting the second measuring device connection (13) to the reference signal input (22) or the second measuring connection (15).
摘要:
The present invention relates to a field device for determining a process variable and providing a measurement signal indicative of the process variable to a remote location via a two-wire current loop. The field device comprises a measurement device for determining the process variable; a current control device electrically connected in series with the measurement device and controllable by the measurement device to provide the measurement signal to the two-wire current loop; and voltage regulation circuitry electrically connected in series with the current control device and the measurement device for controlling a voltage across the current control device towards a desired voltage by varying a voltage across the voltage regulation circuitry.