RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND AND METHOD OF PRODUCING THE SAME
    2.
    发明申请
    RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND AND METHOD OF PRODUCING THE SAME 有权
    耐蚀组合物,耐热型图案的形成方法,聚合物及其制造方法

    公开(公告)号:US20120308928A1

    公开(公告)日:2012-12-06

    申请号:US13477516

    申请日:2012-05-22

    IPC分类号: C08F228/06 G03F7/20 G03F7/004

    摘要: A resist composition including a base component (A) that exhibits changed solubility in a developing solution under action of acid and an acid generator component (B) that generates acid upon exposure, wherein the base component (A) contains a resin component (A1) including a structural unit (a0) represented by general formula (a0-1) shown below and a structural unit (a1)) containing an acid decomposable group that exhibits increased polarity under action of acid, and the amount of the structural unit (a0) is less than 50 mol %, wherein R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; R1 represents a divalent linking group; R2 represents a —SO2— containing cyclic group; and v represents 0 or 1.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸作用下显影溶液中溶解度变差的碱成分(A)和曝光时产生酸的酸发生剂成分(B),其中,所述基材(A)含有树脂成分(A1) (a0)表示的结构单元(a0)和结构单元(a1)),其含有在酸作用下显示出极性增加的酸分解基团,结构单元(a0) 小于50摩尔%,其中R表示氢原子,1至5个碳原子的烷基或1至5个碳原子的卤代烷基; R1表示二价连接基团; R2表示含-SO2-的环状基团; v表示0或1。

    Positive resist composition and method of forming resist pattern
    3.
    发明授权
    Positive resist composition and method of forming resist pattern 有权
    正型抗蚀剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US08450044B2

    公开(公告)日:2013-05-28

    申请号:US12945526

    申请日:2010-11-12

    IPC分类号: G03F7/039 G03F7/20 G03F7/30

    摘要: A positive resist composition including a resin component (A) which exhibits increased solubility in an alkali developing solution under the action of acid and an acid-generator component (B), the resin component (A) including a polymeric compound (A1) having a structural unit (a1) containing an acid dissociable, dissolution inhibiting group, a structural unit (a5) containing a base dissociable group an a structural unit (a6) represented by general formula (a6-1) (R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; each of R2 and R3 independently represents a hydrogen atom or an alkyl group that may contain an oxygen atom at an arbitrary position, or R2 and R3 are bonded together to form an alkylene group; and W represents a cyclic alkylene group that may include an oxygen atom at an arbitrary position).

    摘要翻译: 一种正性抗蚀剂组合物,其包含在酸和酸发生剂组分(B)的作用下在碱性显影液中显示增加的溶解性的树脂组分(A),所述树脂组分(A)包含具有 含有酸解离性溶解抑制基团的结构单元(a1),含有碱解离基团的结构单元(a5),由通式(a6-1)表示的结构单元(a6)(R表示氢原子,烷基 1至5个碳原子的基团或1至5个碳原子的卤代烷基; R 2和R 3各自独立地表示可以在任意位置含有氧原子的氢原子或烷基,或者R 2和R 3键合 一起形成亚烷基; W表示可以在任意位置包含氧原子的环状亚烷基。

    Positive resist composition, method of forming resist pattern, and polymeric compound
    7.
    发明授权
    Positive resist composition, method of forming resist pattern, and polymeric compound 有权
    正型抗蚀剂组合物,形成抗蚀剂图案的方法和聚合物

    公开(公告)号:US08735045B2

    公开(公告)日:2014-05-27

    申请号:US12911411

    申请日:2010-10-25

    摘要: A positive resist composition including a base component (A) which exhibits increased solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the base component (A) including a polymeric compound (A1) containing a structural unit (a0) represented by general formula (a0-1) shown below and a structural unit (a1) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group.

    摘要翻译: 一种正性抗蚀剂组合物,其包含在酸的作用下在碱性显影液中显示出增加的溶解度的碱成分(A)和暴露时产生酸的酸产生剂组分(B),所述碱成分(A)包含高分子化合物 A1),其含有由下述通式(a0-1)表示的结构单元(a0)和由含有酸解离的溶解抑制基团的丙烯酸酯衍生的结构单元(a1)。

    Resist composition, and method of forming resist pattern
    8.
    发明授权
    Resist composition, and method of forming resist pattern 有权
    抗蚀剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US08658343B2

    公开(公告)日:2014-02-25

    申请号:US13373965

    申请日:2011-12-05

    IPC分类号: G03F7/004 G03F7/039

    摘要: A resist composition including a base component (A) which exhibits changed solubility in a developing solution under the action of acid, and an acid generator component (B) which generates acid upon exposure, wherein the base component (A) contains a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In formula (a5-1), R represents a hydrogen atom, an alkyl group or a halogenated alkyl group, X represents single bond or divalent linking group, W represents a cyclic alkylene group which may include an oxygen atom at arbitrary position, each of Ra and Rb independently represents a hydrogen atom or an alkyl group which may include an oxygen atom at arbitrary position, or alternatively, Ra and Rb may be bonded to each other to form a ring together with the nitrogen atom in the formula, and p represents integer of 1 to 3.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸的作用下在显影溶液中显示出改变的溶解性的碱成分(A)和曝光时产生酸的酸产生剂成分(B),其中,所述碱成分(A)含有高分子化合物 A1)具有由通式(a5-1)表示的结构单元(a5)。 式(a5-1)中,R表示氢原子,烷基或卤代烷基,X表示单键或二价连接基,W表示可以在任意位置含有氧原子的环状亚烷基, Ra和Rb独立地表示氢原子或可以在任意位置包含氧原子的烷基,或者Ra和Rb可以与式中的氮原子一起形成环,p表示 1〜3的整数。

    METHOD OF FORMING RESIST PATTERN AND NEGATIVE TONE-DEVELOPMENT RESIST COMPOSITION
    9.
    发明申请
    METHOD OF FORMING RESIST PATTERN AND NEGATIVE TONE-DEVELOPMENT RESIST COMPOSITION 有权
    形成电阻图案和负极色调发展电阻组合物的方法

    公开(公告)号:US20140004467A1

    公开(公告)日:2014-01-02

    申请号:US14003708

    申请日:2012-03-07

    IPC分类号: G03F7/32

    摘要: A method of forming a resist pattern including: forming a resist film on a substrate using a resist composition containing a base component (A) which exhibits decreased solubility in an organic solvent by action of an acid; exposing the resist film; and patterning by a negative-tone development using a developing solution containing the organic solvent, wherein the base component (A) contains a resin component (A1) having a structural unit (a0) which generates acid upon exposure and a structural unit (a1) derived from an acrylate ester which may have the hydrogen atom bonded to the carbon atom on the α-position substituted with a substituent and contains an acid decomposable group which exhibits increased polarity by the action of acid, and the developing solution contains a nitrile solvent.

    摘要翻译: 一种形成抗蚀剂图案的方法,包括:使用含有通过酸作用在有机溶剂中溶解度降低的基础组分(A)的抗蚀剂组合物在基材上形成抗蚀剂膜; 曝光抗蚀膜; 以及使用含有有机溶剂的显影液进行负色发展的图案化,其中,所述基材(A)含有具有曝光时产生酸的结构单元(a0)的树脂成分(A1)和结构单元(a1) 衍生自可以具有与被取代基取代的在α位上的碳原子键合的氢原子的丙烯酸酯,并且含有通过酸作用显示出极性增加的酸分解基团,显影液含有腈溶剂。

    Resist composition, method of forming resist pattern and polymeric compound
    10.
    发明授权
    Resist composition, method of forming resist pattern and polymeric compound 有权
    抗蚀剂组合物,抗蚀剂图案和高分子化合物的形成方法

    公开(公告)号:US08927191B2

    公开(公告)日:2015-01-06

    申请号:US13351716

    申请日:2012-01-17

    IPC分类号: G03F7/039 C08F226/06

    摘要: A resist composition including a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, wherein the base component (A) includes a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In the formula (a5-1), R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; each of Ra and Rb independently represents a hydrocarbon group which may have a substituent, and Ra and Rb may be mutually bonded to form a ring.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸作用下在显影液中溶解性变差的碱成分(A)和曝光时产生酸的酸发生剂成分(B),其中,所述碱成分(A)含有高分子化合物 )具有由通式(a5-1)表示的结构单元(a5)。 在式(a5-1)中,R表示氢原子,1〜5个碳原子的烷基或1〜5个碳原子的卤代烷基; Ra和Rb各自独立地表示可以具有取代基的烃基,Ra和Rb可以相互键合形成环。