公开(公告)号：US20140160336A1

公开(公告)日：2014-06-12

申请号：US14150380

申请日：2014-01-08

Applicant: The Trustees of Columbia University in the City of New York

Inventor： Dirk R. ENGLUND

IPC: H04N5/30

CPC classification number: H04N5/30 ,  G01N2021/391 ,  G02B6/241 ,  G02B6/30 ,  G02B27/58 ,  G02B2006/1213

Abstract: Techniques for lens-free imaging using optical resonance, including providing a series of standing waves indexed by a wave vector to an optical resonator having a predetermined dispersion relation. The intensity of the wavelengths corresponding to the standing waves can be measured with a photodetector. A magnitude and shift of the wave vector corresponding to each of the standing waves can be determined, and spatial information in k-space can be determined from the magnitude and shift of the wave vector corresponding to each of the standing waves using an inversion relationship. A transform can be applied to the spatial information to generate an image.

Abstract translation: 使用光学谐振的无镜头成像技术，包括通过波矢量向一个具有预定色散关系的光学谐振器提供一系列驻波。 可以用光电检测器测量与驻波相对应的波长的强度。 可以确定与每个驻波相对应的波矢量的幅度和偏移，并且可以使用反转关系根据与每个驻波对应的波矢量的大小和移位来确定k空间中的空间信息。 可以将变换应用于空间信息以生成图像。

公开(公告)号：US20140196179A1

公开(公告)日：2014-07-10

申请号：US14150389

申请日：2014-01-08

Applicant: The Trustees of Columbia University in the City of New York

Inventor： Dirk R. ENGLUND

IPC: G01Q70/14 ,  G01Q10/00

CPC classification number: G01Q70/14 ,  G01Q10/00 ,  G01Q20/02 ,  G01Q20/04 ,  G01Q70/10

Abstract: Techniques for measuring the topography of a surface using a device including a semiconductor slab having a distal end and a base region, and an air slot therein. A sensor tip can be coupled to the slab below the air-slot. A photonic crystal including a lattice pattern with a cavity region defined by a local perturbation in the lattice pattern can be integrated into the semiconductor slab above and below the air slot, thereby providing a split-cavity photonic crystal resonator integrated into the semiconductor slab.

Abstract translation: 使用包括具有远端和底部区域的半导体板的装置以及其中的空气槽来测量表面的形貌的技术。 传感器尖端可以连接到空气槽下方的板坯。 包括具有由格子图案中的局部扰动限定的空腔区域的格子图案的光子晶体可以集成到空气狭缝上方和下方的半导体板中，从而提供集成到半导体板中的分裂腔光子晶体谐振器。

公开(公告)号：US20150137793A1

公开(公告)日：2015-05-21

申请号：US14566059

申请日：2014-12-10

Applicant: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK

Inventor： Dirk R. ENGLUND ,  Matthew E. TRUSHEIM

IPC: G01R31/28 ,  G01K11/00 ,  G01N21/64 ,  G01R19/00

CPC classification number: G01R31/2851 ,  G01K11/00 ,  G01N21/64 ,  G01N2201/06113 ,  G01R15/24 ,  G01R19/0092 ,  G01R23/17 ,  G01R31/2884 ,  G01R31/311

Abstract: Systems and methods for precision optical imaging of electrical currents and temperature in integrated circuits are disclosed herein. In one aspect of the disclosed subject matter, a method for detecting a characteristic of an integrated circuit can include depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit.

Abstract translation: 本文公开了用于集成电路中的电流和温度的精密光学成像的系统和方法。 在所公开的主题的一个方面，用于检测集成电路的特性的方法可以包括将至少一个具有至少一个颜色中心的金刚石结构沉积到集成电路的一侧上。