Invention Application
US20140196179A1 ULTRA-COMPACT NANOCAVITY-ENHANCED SCANNING PROBE MICROSCOPY AND METHOD
审中-公开
超紧凑型纳米增强扫描探针显微镜和方法
- Patent Title: ULTRA-COMPACT NANOCAVITY-ENHANCED SCANNING PROBE MICROSCOPY AND METHOD
- Patent Title (中): 超紧凑型纳米增强扫描探针显微镜和方法
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Application No.: US14150389Application Date: 2014-01-08
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Publication No.: US20140196179A1Publication Date: 2014-07-10
- Inventor: Dirk R. ENGLUND
- Applicant: The Trustees of Columbia University in the City of New York
- Main IPC: G01Q70/14
- IPC: G01Q70/14 ; G01Q10/00

Abstract:
Techniques for measuring the topography of a surface using a device including a semiconductor slab having a distal end and a base region, and an air slot therein. A sensor tip can be coupled to the slab below the air-slot. A photonic crystal including a lattice pattern with a cavity region defined by a local perturbation in the lattice pattern can be integrated into the semiconductor slab above and below the air slot, thereby providing a split-cavity photonic crystal resonator integrated into the semiconductor slab.
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