Field effect transistor
    2.
    发明授权
    Field effect transistor 有权
    场效应晶体管

    公开(公告)号:US08188471B2

    公开(公告)日:2012-05-29

    申请号:US12671052

    申请日:2008-08-29

    IPC分类号: H01L29/04

    摘要: A field effect transistor is provided including a gate electrode (for example, 15), a source electrode (13), a drain electrode (14) and a channel layer (11) to control current flowing between the source electrode (13) and the drain electrode (14) by applying a voltage to the gate electrode (15). The channel layer (11) is constituted of an amorphous oxide containing In and Si and having a compositional ratio expressed by Si/(In+Si) of not less than 0.05 and not more than 0.40.

    摘要翻译: 提供一种场效应晶体管,其包括栅电极(例如15),源电极(13),漏电极(14)和沟道层(11),以控制在源电极(13)和 漏电极(14)通过向栅电极(15)施加电压。 沟道层(11)由含有In和Si的无定形氧化物构成,Si /(In + Si)表示的组成比不小于0.05且不大于0.40。

    METHOD FOR MANUFACTURING THIN FILM TRANSISTOR
    4.
    发明申请
    METHOD FOR MANUFACTURING THIN FILM TRANSISTOR 有权
    制造薄膜晶体管的方法

    公开(公告)号:US20090269880A1

    公开(公告)日:2009-10-29

    申请号:US12447199

    申请日:2007-11-09

    IPC分类号: H01L21/34

    CPC分类号: H01L29/7869

    摘要: A method for manufacturing a thin film transistor containing an channel layer 11 having indium oxide, including forming an indium oxide film as an channel layer and subjecting the formed indium oxide film to an annealing in an oxidizing atmosphere.

    摘要翻译: 一种制造薄膜晶体管的方法,该薄膜晶体管含有具有氧化铟的沟道层11,包括形成氧化铟膜作为沟道层,并使所形成的氧化铟膜在氧化气氛中进行退火。

    Field effect transistor and process for production thereof
    5.
    发明授权
    Field effect transistor and process for production thereof 有权
    场效应晶体管及其制造方法

    公开(公告)号:US08164090B2

    公开(公告)日:2012-04-24

    申请号:US12573381

    申请日:2009-10-05

    IPC分类号: H01L29/72

    CPC分类号: H01L29/7869 H01L29/78618

    摘要: A field effect transistor has a gate electrode, gate-insulating layer, a channel and a source and drain electrodes connected electrically to the channel, the channel comprising an oxide semiconductor, the source electrode or the drain electrode comprising an oxynitride.

    摘要翻译: 场效应晶体管具有栅极电极,栅极绝缘层,沟道以及与沟道电连接的源极和漏极,所述沟道包括氧化物半导体,源电极或漏电极包括氧氮化物。

    OXYNITRIDE SEMICONDUCTOR
    6.
    发明申请
    OXYNITRIDE SEMICONDUCTOR 有权
    氧化硅半导体

    公开(公告)号:US20100109002A1

    公开(公告)日:2010-05-06

    申请号:US12532185

    申请日:2008-04-23

    IPC分类号: H01L29/12

    CPC分类号: H01L29/7869 H01L29/247

    摘要: Provided is an oxynitride semiconductor comprising a metal oxynitride. The metal oxynitride contains Zn and at least one element selected from the group consisting of In, Ga, Sn, Mg, Si, Ge, Y, Ti, Mo, W, and Al. The metal oxynitride has an atomic composition ratio of N, N/(N+O), of 7 atomic percent or more to 80 atomic percent or less.

    摘要翻译: 提供了包含金属氮氧化物的氧氮化物半导体。 金属氮氧化物含有Zn和选自In,Ga,Sn,Mg,Si,Ge,Y,Ti,Mo,W和Al中的至少一种元素。 金属氮氧化物的原子组成比为N,N /(N + O),为7原子%以上且在80原子%以下。

    FIELD EFFECT TRANSISTOR AND PROCESS FOR PRODUCTION THEREOF
    7.
    发明申请
    FIELD EFFECT TRANSISTOR AND PROCESS FOR PRODUCTION THEREOF 有权
    场效应晶体管及其生产工艺

    公开(公告)号:US20100084655A1

    公开(公告)日:2010-04-08

    申请号:US12573381

    申请日:2009-10-05

    IPC分类号: H01L29/786 H01L21/34

    CPC分类号: H01L29/7869 H01L29/78618

    摘要: A field effect transistor has a gate electrode, gate-insulating layer, a channel and a source and drain electrodes connected electrically to the channel, the channel comprising an oxide semiconductor, the source electrode or the drain electrode comprising an oxynitride.

    摘要翻译: 场效应晶体管具有栅极电极,栅极绝缘层,沟道以及与沟道电连接的源极和漏极,所述沟道包括氧化物半导体,源电极或漏电极包括氧氮化物。

    FIELD-EFFECT TRANSISTOR
    8.
    发明申请
    FIELD-EFFECT TRANSISTOR 审中-公开
    场效应晶体管

    公开(公告)号:US20090189153A1

    公开(公告)日:2009-07-30

    申请号:US12064302

    申请日:2006-09-05

    IPC分类号: H01L29/12

    摘要: Disclosed herein is a field-effect transistor comprising a channel comprised of an oxide semiconductor material including In and Zn. The atomic compositional ratio expressed by In/(In+Zn) is not less than 35 atomic % and not more than 55 atomic %. Ga is not included in the oxide semiconductor material or the atomic compositional ratio expressed by Ga/(In+Zn+Ga) is set to be 30 atomic % or lower when Ga is included therein. The transistor has improved S-value and field-effect mobility.

    摘要翻译: 本文公开了一种场效应晶体管,其包括由包括In和Zn的氧化物半导体材料构成的沟道。 In /(In + Zn)表示的原子组成比为35原子%以上55原子%以下。 Ga不包括在氧化物半导体材料中,或者当Ga包含Ga时,由Ga /(In + Zn + Ga)表示的原子组成比设定为30原子%以下。 晶体管具有改善的S值和场效应迁移率。

    Light emitting device and method of producing a light emitting device
    9.
    发明授权
    Light emitting device and method of producing a light emitting device 有权
    发光装置及其制造方法

    公开(公告)号:US07768031B2

    公开(公告)日:2010-08-03

    申请号:US11677251

    申请日:2007-02-21

    IPC分类号: H01L33/26 H05B33/14

    摘要: To provide a DC drive type inorganic light emitting device excellent in luminous efficiency, provided is a light emitting device, including: a substrate; and a first layer and a second layer laminated on the substrate, in which the second layer is formed of a first portion containing Zn and at least one element chosen from S and Se as its constituent elements; and a second portion containing at least one element chosen from Cu and Ag and at least one element chosen from S and Se as its constituent elements; the first layer is made of a light emitting layer formed of at least one element chosen from S and Se and of Zn; and, in the second layer, the second portion has a cross section parallel to the substrate which tapers toward the first layer.

    摘要翻译: 为了提供发光效率优异的直流驱动型无机发光装置,提供了一种发光装置,包括:基板; 以及层叠在所述基板上的第一层和第二层,其中所述第二层由包含Zn的第一部分和选自S和Se的至少一种元素作为其构成元素形成; 和含有选自Cu和Ag中的至少一种元素的第二部分和选自S和Se的至少一种元素作为其组成元素; 第一层由由至少一种选自S和Se的元素和Zn形成的发光层制成; 并且在第二层中,第二部分具有平行于基板的横截面朝向第一层逐渐变细的横截面。

    AMORPHOUS OXIDE AND FIELD EFFECT TRANSISTOR
    10.
    发明申请
    AMORPHOUS OXIDE AND FIELD EFFECT TRANSISTOR 有权
    非晶氧化物和场效应晶体管

    公开(公告)号:US20100140611A1

    公开(公告)日:2010-06-10

    申请号:US12597934

    申请日:2008-05-22

    IPC分类号: H01L29/22 H01L29/786

    CPC分类号: H01L29/7869 H01L29/247

    摘要: In a field effect transistor, a channel layer of the field effect transistor is composed of an amorphous oxide including In, Zn, N and O, an atomic composition ratio of N to N and O (N/(N+O)) in the amorphous oxide is equal to or larger than 0.01 atomic percent and equal to or smaller than 3 atomic percent, and the amorphous oxide does not include Ga, or, in a case where the amorphous oxide includes Ga, the number of Ga atoms contained in the amorphous oxide is smaller than the number of N atoms.

    摘要翻译: 在场效应晶体管中,场效应晶体管的沟道层由包括In,Zn,N和O的无定形氧化物,N与N的原子组成比和O(N /(N + O))的原子组成比组成 无定形氧化物等于或大于0.01原子%且等于或小于3原子%,并且非晶氧化物不包括Ga,或者在非晶氧化物包括Ga的情况下,包含在 无定形氧化物小于N原子数。