公开(公告)号：US20190066820A1

公开(公告)日：2019-02-28

申请号：US15690303

申请日：2017-08-30

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Chia-Yu Wang ,  Ching-Huang Wang ,  Chun-Jung Lin ,  Tien-Wei Chiang ,  Meng-Chun Shih ,  Kuei-Hung Shen

IPC: G11C29/56 ,  G11C29/50 ,  G11C11/16 ,  H01L27/22

Abstract: The disclosure is related a method for testing a magnetic memory device and a test apparatus are provided. In some exemplary embodiments, the method includes at least the following steps. The magnetic memory device is initialized by applying a first magnetic field to force write a first data to the magnetic memory device. Then, a second magnetic field is applied to the magnetic memory device. Second data may be obtained from the magnetic memory device by performing a chip probing process. Accordingly, performance of the magnetic memory device may be determined based on the second data.

公开(公告)号：US10665321B2

公开(公告)日：2020-05-26

申请号：US15690303

申请日：2017-08-30

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Chia-Yu Wang ,  Ching-Huang Wang ,  Chun-Jung Lin ,  Tien-Wei Chiang ,  Meng-Chun Shih ,  Kuei-Hung Shen

IPC: G11C29/00 ,  G11C29/56 ,  G11C29/50 ,  G11C11/16 ,  H01L27/22 ,  G11C29/44 ,  G11C29/04 ,  G11C29/10

Abstract: The disclosure is related a method for testing a magnetic memory device and a test apparatus are provided. In some exemplary embodiments, the method includes at least the following steps. The magnetic memory device is initialized by applying a first magnetic field to force write a first data to the magnetic memory device. Then, a second magnetic field is applied to the magnetic memory device. Second data may be obtained from the magnetic memory device by performing a chip probing process. Accordingly, performance of the magnetic memory device may be determined based on the second data.