公开(公告)号：US20240369346A1

公开(公告)日：2024-11-07

申请号：US18032342

申请日：2021-11-25

Applicant: Sun Yat-sen University

Inventor： Xia YANG ,  Junyou QIN ,  Guisong GUO ,  Xiaohu ZHANG

IPC: G01B11/00 ,  G01B11/26 ,  G06T7/73

Abstract: The present disclosure provides a method and system for high-precision localization of a surface of an object, the method including: making marks with a pre-set distribution density on the surface of the object; photographing the marked object and numbering the marks in the image; acquiring relative position information about each mark on the surface of the object and establishing a corresponding relationship between mark numbers and mark position information; acquiring a real-time to-be-measured image and detecting marks in the real-time to-be-measured image; and calculating to obtain a position of the surface of the object corresponding to the current real-time to-be-measured image. The system includes: a mark making module, a numbering module, a mark position relationship module, a to-be-measured image module and a physical quantity calculation module.