Invention Application
- Patent Title: Method and System for High-precision Localization of Surface of Object
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Application No.: US18032342Application Date: 2021-11-25
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Publication No.: US20240369346A1Publication Date: 2024-11-07
- Inventor: Xia YANG , Junyou QIN , Guisong GUO , Xiaohu ZHANG
- Applicant: Sun Yat-sen University
- Applicant Address: CN Guangzhou
- Assignee: Sun Yat-sen University
- Current Assignee: Sun Yat-sen University
- Current Assignee Address: CN Guangzhou
- Priority: CN202111193896.6 20211013
- International Application: PCT/CN2021/133252 WO 20211125
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B11/26 ; G06T7/73

Abstract:
The present disclosure provides a method and system for high-precision localization of a surface of an object, the method including: making marks with a pre-set distribution density on the surface of the object; photographing the marked object and numbering the marks in the image; acquiring relative position information about each mark on the surface of the object and establishing a corresponding relationship between mark numbers and mark position information; acquiring a real-time to-be-measured image and detecting marks in the real-time to-be-measured image; and calculating to obtain a position of the surface of the object corresponding to the current real-time to-be-measured image. The system includes: a mark making module, a numbering module, a mark position relationship module, a to-be-measured image module and a physical quantity calculation module.
Information query