Method and System for High-precision Localization of Surface of Object
Abstract:
The present disclosure provides a method and system for high-precision localization of a surface of an object, the method including: making marks with a pre-set distribution density on the surface of the object; photographing the marked object and numbering the marks in the image; acquiring relative position information about each mark on the surface of the object and establishing a corresponding relationship between mark numbers and mark position information; acquiring a real-time to-be-measured image and detecting marks in the real-time to-be-measured image; and calculating to obtain a position of the surface of the object corresponding to the current real-time to-be-measured image. The system includes: a mark making module, a numbering module, a mark position relationship module, a to-be-measured image module and a physical quantity calculation module.
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