公开(公告)号：US09134365B2

公开(公告)日：2015-09-15

申请号：US14024364

申请日：2013-09-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Min-Woo Kim ,  Bae-Ki Lee ,  Young-Soo Lee ,  Hyung-Yun Lee

IPC: B07C5/08 ,  G01R31/28 ,  G01R31/26 ,  G01R31/18

CPC classification number: G01R31/2868 ,  G01R31/18 ,  G01R31/26 ,  G01R31/2601 ,  G01R31/2806 ,  G01R31/2893

Abstract: A system for testing semiconductor modules may include a first testing unit, a second testing unit, a classifying unit and a transferring unit. The first testing unit may test functions of the semiconductor modules mounted on a main board. The second testing unit may test the semiconductor modules tested by the first testing unit using a terminal. The classifying unit may classify the semiconductor modules tested by the second testing unit into normal semiconductor modules and abnormal semiconductor modules, or pass/fail. The transferring unit may be connected in-line between the first testing unit and the second testing unit, and between the second testing unit and the classifying unit to transfer the semiconductor modules from the first testing unit to the second testing unit and the classifying unit. Thus, the semiconductor modules may be automatically transferred to the units, so that a test time may be reduced.

Abstract translation: 用于测试半导体模块的系统可以包括第一测试单元，第二测试单元，分类单元和传送单元。 第一测试单元可以测试安装在主板上的半导体模块的功能。 第二测试单元可以使用终端来测试由第一测试单元测试的半导体模块。 分类单元可以将由第二测试单元测试的半导体模块分类为正常半导体模块和异常半导体模块，或者通过/失败。 传送单元可以在第一测试单元和第二测试单元之间以及第二测试单元与分类单元之间的串联连接，以将半导体模块从第一测试单元传送到第二测试单元和分类单元。 因此，可以将半导体模块自动转移到单元，从而可以减少测试时间。

公开(公告)号：US11348361B2

公开(公告)日：2022-05-31

申请号：US17088619

申请日：2020-11-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jong-Il Kim ,  Jae-Young Kim ,  Oh-Hyuck Kwon ,  Hyung-Dal Kim ,  Kwang-Jin Bae ,  Young-Min Seo ,  Young-Soo Lee ,  Dae-Kwang Jung

IPC: G06K9/28 ,  G06V40/13

Abstract: An electronic device is provided. The electronic device may include: a housing including a first face facing a first direction and a second face facing a second direction opposite the first direction, and further including a transparent window comprising at least a portion of the first face; a display device disposed between the first face and the second face of the housing and configured to display information to an outside through the transparent window; an illumination unit comprising light emitting circuitry disposed inside the first face of the housing and configured to emit light toward the transparent window; a reflective unit comprising a reflective surface and disposed between the illumination unit and the transparent window, and including a plurality of reflective structures configured to reflect light emitted from the illumination unit toward the transparent window; and a biometric sensor disposed to face at least a portion of the transparent window and configured to sense light reflected on the transparent window. The electronic device including a fingerprint sensor is capable of ensuring a superior performance using a light source in sensing fingerprint information of a user using a fingerprint sensor located in a display active region. Further, the electronic device is capable of effectively ensuring an amount of incident light transmitted to the biometric sensor using the reflective unit and the transparent window, which substantially completely reflects the light emitted from the light source.

公开(公告)号：US20140166544A1

公开(公告)日：2014-06-19

申请号：US14024364

申请日：2013-09-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Min-Woo Kim ,  Bae-Ki Lee ,  Young-Soo Lee ,  Hyung-Yun Lee

IPC: B07C5/344

CPC classification number: G01R31/2868 ,  G01R31/18 ,  G01R31/26 ,  G01R31/2601 ,  G01R31/2806 ,  G01R31/2893

Abstract: A system for testing semiconductor modules may include a first testing unit, a second testing unit, a classifying unit and a transferring unit. The first testing unit may test functions of the semiconductor modules mounted on a main board. The second testing unit may test the semiconductor modules tested by the first testing unit using a terminal. The classifying unit may classify the semiconductor modules tested by the second testing unit into normal semiconductor modules and abnormal semiconductor modules, or pass/fail. The transferring unit may be connected in-line between the first testing unit and the second testing unit, and between the second testing unit and the classifying unit to transfer the semiconductor modules from the first testing unit to the second testing unit and the classifying unit. Thus, the semiconductor modules may be automatically transferred to the units, so that a test time may be reduced.

Abstract translation: 用于测试半导体模块的系统可以包括第一测试单元，第二测试单元，分类单元和传送单元。 第一测试单元可以测试安装在主板上的半导体模块的功能。 第二测试单元可以使用终端来测试由第一测试单元测试的半导体模块。 分类单元可以将由第二测试单元测试的半导体模块分类为正常半导体模块和异常半导体模块，或者通过/失败。 传送单元可以在第一测试单元和第二测试单元之间以及第二测试单元与分类单元之间的串联连接，以将半导体模块从第一测试单元传送到第二测试单元和分类单元。 因此，可以将半导体模块自动转移到单元，从而可以减少测试时间。

公开(公告)号：US10685205B2

公开(公告)日：2020-06-16

申请号：US16038753

申请日：2018-07-18

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jin-Eui Lee ,  Young-Min Seo ,  Young-Soo Lee ,  Yong-Cheol Park ,  Bong-Jae Rhee

IPC: G06K9/00 ,  G02F1/1333 ,  G06F3/041

Abstract: An electronic device is provided. The electronic device includes an optical sensor, the optical sensor comprising a lighting device configured to emit light, a sensor layer including an array of sensors configured to detect first image information corresponding to an object from light reflected by the object, and a filter layer including openings configured to transmit the light reflected by the object, the filter layer disposed on the sensor layer, wherein the first image information is different from an image of the object identified with naked eyes. The electronic device may be diversified according to embodiments.