公开(公告)号：US09983229B2

公开(公告)日：2018-05-29

申请号：US14743163

申请日：2015-06-18

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jong-won Han ,  Jong-woo Lee ,  Young-gi Min ,  Soon-won Lee ,  Yong-in Lee

IPC: G01R31/00 ,  G01R1/04 ,  H01R24/20 ,  H01B1/02 ,  H01B1/04 ,  H01R13/03 ,  G01R31/26 ,  H01R13/24 ,  H01R107/00

CPC classification number: G01R1/0433 ,  G01R31/26 ,  H01B1/02 ,  H01B1/04 ,  H01R13/03 ,  H01R13/2414 ,  H01R24/20 ,  H01R2107/00 ,  H01R2201/20

Abstract: A test socket is provided that includes a base material including an insulating elastic material and a conductive portion extending through the base material in a thickness direction of the base material, wherein the conductive portion includes a plurality of conductive particle structures arranged in the thickness direction of the base material, and each of the plurality of conductive particle structures includes a plurality of conductive particles having at least one insulating wire and/or at least one conductive wire extending from a surface of the conductive particle, bonded with a material having a functional group.