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公开(公告)号:US12103850B2
公开(公告)日:2024-10-01
申请号:US17060893
申请日:2020-10-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Van Luan Nguyen , Keunwook Shin , Hyeonjin Shin , Changhyun Kim , Changseok Lee , Yeonchoo Cho
IPC: B32B9/00 , C01B32/186
CPC classification number: C01B32/186 , Y10T428/30
Abstract: A method of forming graphene includes: preparing a substrate in a reaction chamber; performing a first growth process of growing a plurality of graphene aggregates apart from each other on the substrate at a first growth rate by using a reaction gas including a carbon source; and performing a second growth process of forming a graphene layer by growing the plurality of graphene aggregates at a second growth rate slower than the first growth rate by using the reaction gas including the carbon source.
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公开(公告)号:US12191392B2
公开(公告)日:2025-01-07
申请号:US17505955
申请日:2021-10-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Van Luan Nguyen , Minsu Seol , Eunkyu Lee , Junyoung Kwon , Hyeonjin Shin , Minseok Yoo
IPC: H01L29/786 , H01L29/16 , H01L29/24
Abstract: A semiconductor device according to an embodiment may include a substrate, an adhesive layer, and a semiconductor layer. The semiconductor layer includes a 2D material having a layered structure. The adhesive layer is interposed between the substrate and the semiconductor layer, and has adhesiveness to a 2D material.
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公开(公告)号:US11961898B2
公开(公告)日:2024-04-16
申请号:US17546303
申请日:2021-12-09
Applicant: Samsung Electronics Co., Ltd.
Inventor: Van Luan Nguyen , Minsu Seol , Junyoung Kwon , Hyeonjin Shin , Minseok Yoo , Yeonchoo Cho
IPC: H01L29/66 , H01L21/02 , H01L21/304 , H01L21/463
CPC classification number: H01L29/66045 , H01L21/02488 , H01L21/02491 , H01L21/02527 , H01L21/02568 , H01L21/304 , H01L21/463 , H01L29/66969
Abstract: A method of patterning a 2D material layer is includes selectively forming a first material layer on a surface of a substrate to form a first region in which the first material layer covers the surface of the substrate and to further form a second region in which the surface of the substrate is exposed from the first material layer, the first material layer having a strong adhesive force with a 2D material. The method further includes forming a 2D material layer is formed in both the first region and the second region. The method further includes selectively removing the 2D material layer from the second region based on using a physical removal method, such that the 2D material layer remains in the first region.
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