公开(公告)号：US11837317B2

公开(公告)日：2023-12-05

申请号：US17409064

申请日：2021-08-23

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sun Young Lim ,  Seung Yong Shin ,  Hyun Duk Cho

IPC: G11C7/10 ,  G11C7/22

CPC classification number: G11C7/1063 ,  G11C7/1057 ,  G11C7/1084 ,  G11C7/222

Abstract: A memory device including a plurality of nonvolatile memory chips each including a status output pin and a buffer chip configured to receive a plurality of internal state signals, which indicate states of the plurality of nonvolatile memory chips, from the status output pins and output an external state signal having a set period on the basis of the internal state signals indicating a particular state, wherein in a first section of the external state signal having the set period, a duty cycle of the external state signal determines depending on an identification (ID) of the nonvolatile memory chip which outputs the internal state signal indicating the particular state among the plurality of nonvolatile memory chips.

公开(公告)号：US10761146B2

公开(公告)日：2020-09-01

申请号：US15887551

申请日：2018-02-02

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jong Hoon Jung ,  Dae Sik Kim ,  Sung Yeol Kim ,  Seung Yong Shin

IPC: G01R31/00 ,  G01R31/44 ,  G01J1/44 ,  G01R1/073 ,  G01R31/26 ,  G01J3/50 ,  G01J1/42

Abstract: Provided are a wafer probe card that matches in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and inspects brightness and wavelength of light emitted from a plurality of LEDs provided on the LED wafer at once by controlling the plurality of LEDs to emit light, an analysis apparatus including the same, and a method of fabricating the wafer probe card.

公开(公告)号：US12230356B2

公开(公告)日：2025-02-18

申请号：US18384973

申请日：2023-10-30

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sun Young Lim ,  Seung Yong Shin ,  Hyun Duk Cho

IPC: G11C7/10 ,  G11C7/22

Abstract: A memory device including a plurality of nonvolatile memory chips each including a status output pin and a buffer chip configured to receive a plurality of internal state signals, which indicate states of the plurality of nonvolatile memory chips, from the status output pins and output an external state signal having a set period on the basis of the internal state signals indicating a particular state, wherein in a first section of the external state signal having the set period, a duty cycle of the external state signal determines depending on an identification (ID) of the nonvolatile memory chip which outputs the internal state signal indicating the particular state among the plurality of nonvolatile memory chips.

公开(公告)号：US11521955B2

公开(公告)日：2022-12-06

申请号：US16955505

申请日：2018-12-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung Yeol Kim ,  Dae Sik Kim ,  Seung Yong Shin ,  Jong Hoon Jung

IPC: H01L25/075 ,  H01L25/16 ,  H01L33/50

Abstract: A display apparatus includes a blue light emitting element configured to emit blue light; a red light emitting element configured to emit red light; and a green light emitting element configured to emit green light. The blue light emitting element may include a first light emitting diode configured to emit light having a maximum intensity at a wavelength shorter than a blue wavelength; and a blue filter configured to transmit light having the blue wavelength.