TEST APPARATUS FOR LIGHT EMITTING DEVICES
    2.
    发明申请

    公开(公告)号:US20170234937A1

    公开(公告)日:2017-08-17

    申请号:US15234417

    申请日:2016-08-11

    CPC classification number: G01R31/44 G01J1/0223 G01J1/42 G01J2001/4252

    Abstract: A testing apparatus includes a plate unit including at least one chip mounting unit on which a light emitting diode (LED) to be tested is mounted. The chip mounting unit has a first region in which the LED is overlaid and a second region surrounding the first region. The first and second electrode pads are disposed in the first region and include respective extension portions extended toward the second region. A probe portion is configured to connect to the extension portions of the first and second electrode pads. A power control unit is configured to selectively apply test power to the LED through the probe portion. A light measuring unit is configured to measure light properties of light emitted by the LED.

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