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公开(公告)号:US20240324188A1
公开(公告)日:2024-09-26
申请号:US18606436
申请日:2024-03-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kangin KIM , Sangbin AHN , Youngseung CHO , Kyounghwan KIM
IPC: H10B12/00 , H01L29/423 , H01L29/66 , H01L29/78
CPC classification number: H10B12/488 , H01L29/4236 , H01L29/6681 , H01L29/7851 , H10B12/36
Abstract: An integrated circuit device includes a substrate including a plurality of active areas and a plurality of dummy active areas, and defines a plurality of word line trenches that cross the plurality of active areas and the plurality of dummy active area, extend in a first horizontal direction in parallel with each other and have an active side bottom surface exposing the plurality of active areas and a dummy side bottom surface exposing the plurality of dummy active areas. The dummy side bottom surface is at a lower vertical level than the active side bottom surface.
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2.
公开(公告)号:US20250144768A1
公开(公告)日:2025-05-08
申请号:US18910425
申请日:2024-10-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Heesung KIM , Kangin KIM , Dongwoo LEE
IPC: B24B37/34 , B24B53/007 , B24B57/02
Abstract: Provided is a brush aging pad configured to age a surface protrusion of a brush configured to clean a semiconductor wafer in a chemical mechanical polishing cleaning apparatus, the brush aging pad including a pad body, wherein a roughness of at least one surface of the pad body ranges from 1 μm to 5 μm.
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