-
公开(公告)号：US11354798B2
公开(公告)日：2022-06-07
申请号：US16886591
申请日：2020-05-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kang Won Lee , Cheol Ki Min , Jong Ju Park , Hyon Seok Song
Abstract: A defect inspecting apparatus includes a reference image generator configured to generate a first reference image and a second reference image from design layout data. An image inspector is configured to obtain a first inspection image of a first inspection region of a photomask and a second inspection image of a second inspection region of the photomask. An operation processor is configured to extract a first coordinate offset by comparing the first inspection image with the first reference image and to extract a second coordinate offset by comparing the second inspection image with the second reference image.
-
公开(公告)号：US11204680B2
公开(公告)日：2021-12-21
申请号：US16821017
申请日：2020-03-17
Applicant: Samsung Electronics Co., Ltd.
Inventor： Hyung Min Yook , Sung Sik Yoo , Kang Won Lee , Myeong Lo Lee , Young Ae Kang , Hui Chul Yang , Yong Ki Min
IPC: G06F3/0481 , G06F3/0486 , G06F3/0488 , G06F3/14 , G09G5/14
Abstract: A method of supporting divided screen areas and a mobile terminal employing the same are disclosed. The method includes: generating input signals for one of sequentially and simultaneously activating a plurality of user functions; activating the user functions according to generated input signals; dividing a screen into divided screen areas that correspond to activated user functions; and outputting functional view areas associated with the activated user functions to the corresponding divided screen areas.
-
公开(公告)号：US11797149B2
公开(公告)日：2023-10-24
申请号：US17484018
申请日：2021-09-24
Applicant: Samsung Electronics Co., Ltd.
Inventor： Hyung Min Yook , Sung Sik Yoo , Kang Won Lee , Myeong Lo Lee , Young Ae Kang , Hui Chui Yang , Yong Ki Min
IPC: G06F3/04817 , G06F3/0481 , G06F3/0486 , G06F3/04886 , G06F3/14 , G09G5/14
CPC classification number: G06F3/04817 , G06F3/0481 , G06F3/0486 , G06F3/04886 , G06F3/1415 , G06F3/1431 , G09G5/14 , G06F2203/04803 , G09G2340/045 , G09G2340/0407 , G09G2340/0414 , G09G2340/0421 , G09G2340/0442 , G09G2340/0464 , G09G2340/0471 , G09G2340/0478
Abstract: A method of supporting divided screen areas and a mobile terminal employing the same are disclosed. The method includes: generating input signals for one of sequentially and simultaneously activating a plurality of user functions; activating the user functions according to generated input signals; dividing a screen into divided screen areas that correspond to activated user functions; and outputting functional view areas associated with the activated user functions to the corresponding divided screen areas.
-
公开(公告)号：US10659593B2
公开(公告)日：2020-05-19
申请号：US15903454
申请日：2018-02-23
Applicant: Samsung Electronics Co., Ltd.
Inventor： Se Youp Chu , Seung Kwon Park , Kang Won Lee , Jong Wu Baek , Eun Yeung Lee
Abstract: An electronic device includes a housing, one or more input/output (I/O) interfaces included in or on the housing, a processor, and a memory, wherein the memory stores a plurality of templates associated with a plurality of tasks, wherein each of the templates includes a plurality of parameters for at least partially completing a respective one of the tasks, and wherein the memory further stores instructions that, when executed, cause the processor to: receive a user input to set up an alarm associated with a task to be performed at a selected time, wherein the input includes a first time parameter associated with the selected time; select one of the plurality of templates; determine a second time parameter of the plurality of parameters of the selected template; determine a time for the alarm; and provide the alarm at the determined time.
-
Patent Agency Ranking
公开(公告)号：US10726541B2
公开(公告)日：2020-07-28
申请号：US16013417
申请日：2018-06-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kang Won Lee , Cheol Ki Min , Jong Ju Park , Hyon Seok Song
Abstract: A defect inspecting apparatus includes a reference image generator configured to generate a first reference image and a second reference image from design layout data. An image inspector is configured to obtain a first inspection image of a first inspection region of a photomask and a second inspection image of a second inspection region of the photomask. An operation processor is configured to extract a first coordinate offset by comparing the first inspection image with the first reference image and to extract a second coordinate offset by comparing the second inspection image with the second reference image.
-
公开(公告)号：US10209858B2
公开(公告)日：2019-02-19
申请号：US13972291
申请日：2013-08-21
Applicant: Samsung Electronics Co., Ltd.
Inventor： Hyung Min Yook , Sung Sik Yoo , Kang Won Lee , Myeong Lo Lee , Young Ae Kang , Hui Chul Yang , Yong Ki Min
IPC: G06F3/048 , G06F3/0481 , G06F3/0486 , G06F3/0488 , G06F3/14 , G09G5/14
Abstract: A method of supporting divided screen areas and a mobile terminal employing the same are disclosed. The method includes: generating input signals for one of sequentially and simultaneously activating a plurality of user functions; activating the user functions according to generated input signals; dividing a screen into divided screen areas that correspond to activated user functions; and outputting functional view areas associated with the activated user functions to the corresponding divided screen areas.
-
公开(公告)号：US11727557B2
公开(公告)日：2023-08-15
申请号：US17661830
申请日：2022-05-03
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kang Won Lee , Cheol Ki Min , Jong Ju Park , Hyon Seok Song
CPC classification number: G06T7/001 , G06T7/337 , G06T7/97 , G06T2207/30148
Abstract: A defect inspecting apparatus includes a reference image generator configured to generate a first reference image and a second reference image from design layout data. An image inspector is configured to obtain a first inspection image of a first inspection region of a photomask and a second inspection image of a second inspection region of the photomask. An operation processor is configured to extract a first coordinate offset by comparing the first inspection image with the first reference image and to extract a second coordinate offset by comparing the second inspection image with the second reference image.
-
公开(公告)号：US11093106B2
公开(公告)日：2021-08-17
申请号：US16261878
申请日：2019-01-30
Applicant: Samsung Electronics Co., Ltd.
Inventor： Hyung Min Yook , Sung Sik Yoo , Kang Won Lee , Myeong Lo Lee , Young Ae Kang , Hui Chul Yang , Yong Ki Min
IPC: G06F3/0481 , G06F3/0486 , G06F3/0488 , G06F3/14 , G09G5/14
Abstract: A method of supporting divided screen areas and a mobile terminal employing the same are disclosed. The method includes: generating input signals for one of sequentially and simultaneously activating a plurality of user functions; activating the user functions according to generated input signals; dividing a screen into divided screen areas that correspond to activated user functions; and outputting functional view areas associated with the activated user functions to the corresponding divided screen areas.
-
公开(公告)号：US20190139209A1
公开(公告)日：2019-05-09
申请号：US16013417
申请日：2018-06-20
Applicant: SAMSUNG ELECTRONICS CO., LTD
Inventor： Kang Won Lee , Cheol Ki Min , Jong Ju Park , Hyon Seok Song
Abstract: A defect inspecting apparatus includes a reference image generator configured to generate a first reference image and a second reference image from design layout data. An image inspector is configured to obtain a first inspection image of a first inspection region of a photomask and a second inspection image of a second inspection region of the photomask. An operation processor is configured to extract a first coordinate offset by comparing the first inspection image with the first reference image and to extract a second coordinate offset by comparing the second inspection image with the second reference image.
-
-
-
-
-
-
-
-
Search Results
9
records
(took 0.015 seconds)
