公开(公告)号：US20230175974A1

公开(公告)日：2023-06-08

申请号：US17940308

申请日：2022-09-08

Applicant: Samsung Electronics Co., Ltd.

Inventor： Junghoon CHOI ,  Yunsong JEONG ,  Sangyong YU

IPC: G01N21/88 ,  G01N21/956

CPC classification number: G01N21/8806 ,  G01N21/956 ,  G01N2021/95676

Abstract: An inspection system includes a stage unit configured to load a blank mask thereon. A side illumination unit, which is disposed to face a side surface of the blank mask and includes a plurality of LEDs, is provided. A camera disposed adjacent to the blank mask is provided. An inspection light beam irradiated from the side illumination unit toward the side surface of the blank mask is substantially parallel to an upper surface of the blank mask.

公开(公告)号：US20220187942A1

公开(公告)日：2022-06-16

申请号：US17432275

申请日：2020-02-17

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sanghun KWAK ,  Daehyun YOO ,  Bongjun KO ,  Mansung KIM ,  Jaeho LEE ,  Junghoon CHOI ,  Changjin KIM ,  Sangheon PARK ,  Jongdae PARK

IPC: G06F3/041 ,  G06F3/044

Abstract: According to an embodiment, an electronic device may include: a processor; and a touch circuit configured to output, to the processor, information associated with a touch on at least one surface of the electronic device. The touch circuit may be configured to: generate first raw data including a first value associated with capacitance for each of multiple channels of the touch circuit; generate a first baseline on the basis of the first raw data; identify whether the first raw data satisfies a designated condition; and identify whether the first baseline is reset, on the basis of whether the raw data satisfies the designated condition.