Abstract:
An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.
Abstract:
An image sensor which operates in a global shutter mode is provided. The image sensor includes a pixel array comprising a plurality of pixels arranged in a plurality of rows and columns, a timing generator configured to generate row driver control signals which controls an integration period of a pixel of the plurality of pixels to include at least two sub integration periods, and a row driver configured to generate a plurality of row control signals which controls each of the rows in the pixel array based on the row driver control signals, wherein the timing generator is further configured to control a single image frame to include the integration period and a readout period of the pixel, based on the row driver control signals.
Abstract:
An image sensor operating in a skip mode and reading out a pixel signal provided by at least one of a plurality of pixels and compensating for fixed pattern noise (FPN) in column-parallel pipelines. The image sensor includes; a switch signal generator that generates a first switch control signal and a second switch control signal in response to FPN location information characterizing a first pipeline among the column-parallel pipelines as a noisy pipeline generating FPN, and characterizing a second pipeline among the column-parallel pipelines as a quiet pipeline not generating FPN, a binning switch block including a first switch controlled by the first switch control signal and a second switch controlled by the second switch control signal, wherein the first switch control signal causes the first pipeline to be inactivated and the second switch control signal causes the second pipeline to be activated, and a binning block that performs a digital binning operation on digital signals provided via the column-parallel pipelines including the second pipeline.
Abstract:
An image sensor includes a first column pair and a second column pair among a plurality of columns of a pixel array, an analog-to-digital converter pair, and a switch arrangement circuit configured to connect the first column pair with the analog-to-digital converter pair in response to first switch control signals such that two rows among a plurality of rows in the pixel array are read during a single access time.
Abstract:
Image sensors include an array of image sensor pixels therein. This array of image sensor pixels includes a first focus detection pixel and at least a first color pixel. A switching network is provided, which is electrically coupled to the array. This switching network may be configured to generate a first mixed image signal by electronically mixing a focus detection signal generated by the first focus detection pixel with at least one color pixel signal generated by the at least a first color pixel. The first focus detection pixel can be a color-blind pixel, which may include a light-blocking shield mask therein.
Abstract:
A CDS circuit includes first capacitors; second capacitors; and a switch arrangement which, in response to a switch control signal, connects the first capacitors in series between a pixel signal output node and a ground to compress the pixel signal and connects the second capacitors in series between a ramp signal output node and the ground to compress the ramp signal, or connects the first capacitors in parallel between the pixel signal output node and a first input node of the comparator and connects the second capacitors in parallel between the ramp signal output node and a second input node of the comparator.
Abstract:
Image sensors include an array of image sensor pixels therein. This array of image sensor pixels includes a first focus detection pixel and at least a first color pixel. A switching network is provided, which is electrically coupled to the array. This switching network may be configured to generate a first mixed image signal by electronically mixing a focus detection signal generated by the first focus detection pixel with at least one color pixel signal generated by the at least a first color pixel. The first focus detection pixel can be a color-blind pixel, which may include a light-blocking shield mask therein.
Abstract:
An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.
Abstract:
An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.
Abstract:
A correlated double sampling (CDS) circuit includes a correction circuit configured to receive an input pixel signal through a first node via a column line, correct the input pixel signal, and output the corrected pixel signal through a second node; and a comparator including first and second input terminals, the first input terminal being connected to the second node and being configured to receive the corrected pixel signal, and the second input terminal configured to receive a ramp signal, the comparator being configured to compare the corrected pixel signal with the ramp signal and output a comparison signal indicating a result of the comparing, wherein the correction circuit includes, a first capacitor connected between the first and second nodes, and one or more metal lines disposed adjacent to the first capacitor, and wherein at least one other capacitor is formed by the first capacitor and the metal line.