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公开(公告)号:US20240072177A1
公开(公告)日:2024-02-29
申请号:US18345130
申请日:2023-06-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Chul Kim , Yeondo Jung , Gwirim Park , Yelin Lee , Kichul Kim , Kyungin Choi
IPC: H01L29/786 , H01L29/06 , H01L29/423 , H01L29/66 , H01L29/775
CPC classification number: H01L29/78696 , H01L29/0673 , H01L29/42392 , H01L29/66439 , H01L29/66545 , H01L29/66553 , H01L29/6656 , H01L29/775 , H01L29/4908
Abstract: A semiconductor device includes channels spaced apart from each other on a substrate in a vertical direction substantially perpendicular to an upper surface of the substrate, a gate structure on the substrate and bordering lower and upper surfaces and a first sidewall of at least a portion of each of the channels, and a source/drain layer on a portion of the substrate adjacent to the gate structure and contacting second sidewalls of the channels. A nitrogen-containing portion is formed at an upper portion of an uppermost one of the channels, and may be doped with nitrogen.
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公开(公告)号:US20240088150A1
公开(公告)日:2024-03-14
申请号:US18300867
申请日:2023-04-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yeondo Jung , Chul Kim , Kichul Kim , Gwirim Park , Haejun Yu , Chaeyeong Lee , Kyungin Choi
IPC: H01L27/092 , H01L29/06 , H01L29/423 , H01L29/66 , H01L29/775 , H01L29/786
CPC classification number: H01L27/092 , H01L29/0673 , H01L29/42392 , H01L29/66545 , H01L29/775 , H01L29/78696
Abstract: An integrated circuit device includes a pair of fin-type active regions, which extend in a first horizontal direction on a substrate, and a fin isolation insulator between ones of the pair of fin-type active regions to extend in a second horizontal direction that intersects with the first horizontal direction. The fin isolation insulator includes a first nitrogen-rich barrier film having at least one protrusion at a position that is higher than respective top surfaces of each of the pair of fin-type active regions with respect to the substrate, and a second nitrogen-rich barrier film, which is spaced apart from the first nitrogen-rich barrier film and is in a space defined by the first nitrogen-rich barrier film.
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