SYSTEM-IN-PACKAGE MODULE
    2.
    发明申请

    公开(公告)号:US20210118848A1

    公开(公告)日:2021-04-22

    申请号:US16883153

    申请日:2020-05-26

    Abstract: A system-in-package module includes a substrate, an application specific integrated circuit (ASIC) chip on the substrate, first wafer level package (WLP) memories on the substrate spaced apart from the ASIC chip in a first direction parallel to an upper surface of the substrate, and second WLP memories on the substrate spaced apart from the ASIC chip in a direction opposite to the first direction.

    SEMICONDUCTOR PACKAGE
    4.
    发明申请

    公开(公告)号:US20220165721A1

    公开(公告)日:2022-05-26

    申请号:US17369228

    申请日:2021-07-07

    Abstract: A semiconductor package including a first semiconductor chip including a logic structure and a second semiconductor chip bonded to the first semiconductor chip may be provided. The first semiconductor chip may include signal lines on a first surface of a first semiconductor substrate and connected to the logic structure, a power delivery network on a second surface of the first semiconductor substrate, the second surface being opposite to the first surface, and penetration vias penetrating the first semiconductor substrate and connecting the power delivery network to the logic structure. The second semiconductor chip may include a capacitor layer that is on a second semiconductor substrate and is adjacent to the power delivery network.

    SEMICONDUCTOR PACKAGE
    6.
    发明申请

    公开(公告)号:US20220415775A1

    公开(公告)日:2022-12-29

    申请号:US17687796

    申请日:2022-03-07

    Abstract: A semiconductor package is disclosed. The semiconductor package may include a package substrate, an upper semiconductor chip on the package substrate, and a lower semiconductor chip between the package substrate and the upper semiconductor chip. The upper semiconductor chip may include a core region having a power circuit thereon and a logic cell region having a logic circuit thereon. The lower semiconductor chip may include a power wire region vertically overlapping the core region. The lower semiconductor chip may include a first substrate, a first through electrode, and a second through electrode, the first substrate including an active surface having an integrated circuit thereon, and a first through electrode and a second through electrode penetrating the first substrate in the power wire region. A distance between the first and second through electrodes may be smaller than a width of the first through electrode.

    SYSTEM-IN-PACKAGE MODULE
    7.
    发明申请

    公开(公告)号:US20220328454A1

    公开(公告)日:2022-10-13

    申请号:US17853140

    申请日:2022-06-29

    Abstract: A system-in-package module includes a substrate, an application specific integrated circuit (ASIC) chip on the substrate, first wafer level package (WLP) memories on the substrate spaced apart from the ASIC chip in a first direction parallel to an upper surface of the substrate, and second WLP memories on the substrate spaced apart from the ASIC chip in a direction opposite to the first direction.

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