METHOD AND APPARATUS FOR PROCESSING USER INPUT
    7.
    发明申请
    METHOD AND APPARATUS FOR PROCESSING USER INPUT 审中-公开
    处理用户输入的方法和装置

    公开(公告)号:US20140059449A1

    公开(公告)日:2014-02-27

    申请号:US14011618

    申请日:2013-08-27

    Abstract: A method processes a user input according to an identified input mode among a set of input modes. The method for processing an input in a portable device, includes detect a user input from an input region, identifying an input mode from a set of input modes including at least one of a text input, a drawing input, an equation input, and a drawing input, and processing the user input according to the input mode to create a message, wherein the message comprises at least one input content processed according to the identified input mode.

    Abstract translation: 一种方法在一组输入模式中根据所识别的输入模式处理用户输入。 用于处理便携式设备中的输入的方法包括从输入区域检测用户输入,从一组输入模式识别输入模式,所述输入模式包括文本输入,绘图输入,等式输入和方程输入中的至少一个 绘制输入,以及根据所述输入模式处理所述用户输入以创建消息,其中所述消息包括根据所识别的输入模式处理的至少一个输入内容。

    Substrate inspection method and method of fabricating a semiconductor device using the same

    公开(公告)号:US11486834B2

    公开(公告)日:2022-11-01

    申请号:US16709222

    申请日:2019-12-10

    Abstract: Disclosed are a substrate inspection method and a method of fabricating a semiconductor device using the same. The inspection method may include measuring a target area of a substrate using a pulsed beam to obtain a first peak, measuring a near field ultrasound, which is produced by the pulsed beam in a near field region including the target area, using a first continuous wave beam different from the pulsed beam to obtain a second peak, and measuring a far field ultrasound, which is produced by the near field ultrasound in a far field region outside the near field region, using a second continuous wave beam to examine material characteristics of the substrate.

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