公开(公告)号：US20230089435A1

公开(公告)日：2023-03-23

申请号：US17909277

申请日：2020-06-05

Applicant: Samsung Display Co., LTD.

Inventor： Yong Woon LIM

IPC: H01L33/38 ,  H01L25/075 ,  H01L33/62 ,  H01L33/00

Abstract: Provided are a display device and a manufacturing method therefor. The display device includes: a first substrate; a first electrode and a second electrode spaced apart from each other on the first substrate; a plurality of light emitting elements at least a portion of which is arranged between the first electrode and the second electrode; a first contact electrode at least partially covering the first electrode and contacting one end of each of the light emitting elements; and a second contact electrode spaced apart from the first contact electrode to at least partially cover the second electrode and contacting the other end of each of the light emitting elements, wherein the first contact electrode and the second contact electrode comprise a conductive polymer.

公开(公告)号：US20230064942A1

公开(公告)日：2023-03-02

申请号：US17730442

申请日：2022-04-27

Applicant: Samsung Display Co., LTD.

Inventor： Eon Pil SHIN ,  Myoungchul KIM ,  Donghoon LEE ,  Jihoon SEO ,  Yong Woon LIM ,  Moonsung CHOI ,  Hyunju WOO ,  Seokwoo JEONG

IPC: H01L51/56 ,  H01L21/66 ,  H01L27/32 ,  G01N21/65

Abstract: A method of determining crystallinity may include acquiring a Raman spectrum of each of samples that are crystallized, determining a first sample that exhibits a first Raman spectrum having a first Raman intensity that is largest among the Raman spectra, as an optimal sample, and determining a second sample that exhibits a second Raman spectrum having a second Raman intensity that is within a range from the first Raman intensity based on the first Raman intensity, as a first normal sample.

公开(公告)号：US20210239959A1

公开(公告)日：2021-08-05

申请号：US17109004

申请日：2020-12-01

Applicant: Samsung Display Co., Ltd.

Inventor： Yong Woon LIM

IPC: G02B21/16 ,  G02B21/36 ,  G02B27/10 ,  G02B21/08 ,  G02B26/08 ,  G01N21/64 ,  H04N9/04 ,  H04N5/247 ,  G06T7/00 ,  H04N5/225

Abstract: An optical inspection apparatus includes: a first filter having a plurality of passbands; a first beam splitter to reflect a first light that exits from the first filter to transfer the first light to an inspection target; a second beam splitter to split a second light, which is provided by reflecting the first light by the inspection target, into a first split light and a second split light; a second filter to receive the first split light, and having a passband different from the passbands of the first filter; a fluorescence microscope to generate a fluorescence image from a third light that exits from the second filter; and a first imaging module to generate a first image from the second split light.