Display device being resistant to short-circuiting

    公开(公告)号:US10162237B2

    公开(公告)日:2018-12-25

    申请号:US15040096

    申请日:2016-02-10

    Abstract: A display device includes a first substrate including a display area and a peripheral area disposed in a periphery of the display area. A gate line is disposed in the display area. A data line is insulated from the gate line and intersects the gate line. The data line includes a first portion and a second portion. The first portion is disposed in the display area, and the second portion is connected to the first portion and is disposed in the peripheral area. A thin-film transistor (TFT) is disposed in the display area of the first substrate and is connected to the gate and data lines. A first insulating pattern is disposed on the TFT. A second insulating pattern is disposed in the peripheral area and covers a part of the second portion of the data line. The second insulating pattern includes a same material as the first insulating pattern.

    DISPLAY DEVICE BEING RESISTANT TO SHORT-CIRCUITING
    2.
    发明申请
    DISPLAY DEVICE BEING RESISTANT TO SHORT-CIRCUITING 审中-公开
    显示器件抗短路电阻

    公开(公告)号:US20170023839A1

    公开(公告)日:2017-01-26

    申请号:US15040096

    申请日:2016-02-10

    Abstract: A display device includes a first substrate including a display area and a peripheral area disposed in a periphery of the display area. A gate line is disposed in the display area. A data line is insulated from the gate line and intersects the gate line. The data line includes a first portion and a second portion. The first portion is disposed in the display area, and the second portion is connected to the first portion and is disposed in the peripheral area. A thin-film transistor (TFT) is disposed in the display area of the first substrate and is connected to the gate and data lines. A first insulating pattern is disposed on the TFT. A second insulating pattern is disposed in the peripheral area and covers a part of the second portion of the data line. The second insulating pattern includes a same material as the first insulating pattern.

    Abstract translation: 显示装置包括:第一基板,包括显示区域和布置在显示区域周边的外围区域。 栅极线设置在显示区域中。 数据线与栅极线绝缘,并与栅极线相交。 数据线包括第一部分和第二部分。 第一部分设置在显示区域中,第二部分连接到第一部分并且设置在周边区域中。 薄膜晶体管(TFT)设置在第一基板的显示区域中并连接到栅极和数据线。 第一绝缘图案设置在TFT上。 第二绝缘图案设置在周边区域中并且覆盖数据线的第二部分的一部分。 第二绝缘图案包括与第一绝缘图案相同的材料。

    Display device and method of testing display device

    公开(公告)号:US11062631B2

    公开(公告)日:2021-07-13

    申请号:US16731369

    申请日:2019-12-31

    Abstract: A display device includes: a display panel including signal lines in a display area and a peripheral area, the signal lines extending in a column direction and spaced apart; and test lines electrically connected to the signal lines in the peripheral area, extending in the column direction and arranged to be spaced apart. The peripheral area includes: a first peripheral area; and a second peripheral area located between the display area and the first peripheral area. The test lines include: a first test line including: a 1-1 testing portion disposed on the first peripheral area; and a 1-2 testing portion disposed on the second peripheral area; and a second test line including: a 2-1 testing portion disposed on the second peripheral area. A width of the 1-1 testing portion of the first test line is larger than a width of the 1-2 testing portion of the first test line.

    DISPLAY DEVICE AND METHOD OF TESTING DISPLAY DEVICE

    公开(公告)号:US20200312205A1

    公开(公告)日:2020-10-01

    申请号:US16731369

    申请日:2019-12-31

    Abstract: A display device includes: a display panel including signal lines in a display area and a peripheral area, the signal lines extending in a column direction and spaced apart; and test lines electrically connected to the signal lines in the peripheral area, extending in the column direction and arranged to be spaced apart. The peripheral area includes: a first peripheral area; and a second peripheral area located between the display area and the first peripheral area. The test lines include: a first test line including: a 1-1 testing portion disposed on the first peripheral area; and a 1-2 testing portion disposed on the second peripheral area; and a second test line including: a 2-1 testing portion disposed on the second peripheral area. A width of the 1-1 testing portion of the first test line is larger than a width of the 1-2 testing portion of the first test line.

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