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公开(公告)号：US11062631B2
公开(公告)日：2021-07-13
申请号：US16731369
申请日：2019-12-31
Applicant: Samsung Display Co., Ltd.
Inventor： Kwan Yup Shin , Jun Ho Bae , Jae Hyoung Youn , Da Young Lee
Abstract: A display device includes: a display panel including signal lines in a display area and a peripheral area, the signal lines extending in a column direction and spaced apart; and test lines electrically connected to the signal lines in the peripheral area, extending in the column direction and arranged to be spaced apart. The peripheral area includes: a first peripheral area; and a second peripheral area located between the display area and the first peripheral area. The test lines include: a first test line including: a 1-1 testing portion disposed on the first peripheral area; and a 1-2 testing portion disposed on the second peripheral area; and a second test line including: a 2-1 testing portion disposed on the second peripheral area. A width of the 1-1 testing portion of the first test line is larger than a width of the 1-2 testing portion of the first test line.
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公开(公告)号：US20200312205A1
公开(公告)日：2020-10-01
申请号：US16731369
申请日：2019-12-31
Applicant: Samsung Display Co., Ltd.
Inventor： Kwan Yup Shin , Jun Ho Bae , Jae Hyoung Youn , Da Young Lee
Abstract: A display device includes: a display panel including signal lines in a display area and a peripheral area, the signal lines extending in a column direction and spaced apart; and test lines electrically connected to the signal lines in the peripheral area, extending in the column direction and arranged to be spaced apart. The peripheral area includes: a first peripheral area; and a second peripheral area located between the display area and the first peripheral area. The test lines include: a first test line including: a 1-1 testing portion disposed on the first peripheral area; and a 1-2 testing portion disposed on the second peripheral area; and a second test line including: a 2-1 testing portion disposed on the second peripheral area. A width of the 1-1 testing portion of the first test line is larger than a width of the 1-2 testing portion of the first test line.
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