公开(公告)号：US20180247877A1

公开(公告)日：2018-08-30

申请号：US15964544

申请日：2018-04-27

Applicant: Samsung Display Co., Ltd.

Inventor： Ji-Yun HONG ,  Joon-Geol KIM ,  Jin-Won LEE ,  Ki-Won KIM

IPC: H01L21/66 ,  H01L27/12 ,  G09G3/00

Abstract: A display panel includes first and second test lines connected to the each of data lines, extending in the second direction, and arranged in the first direction, a first test pad electrically connected to the first test line, the first test pad and the first test line being formed from a same layer, and a second test pad electrically connected to the second test line through a contact hole formed through a first insulation layer and disposed adjacent to the first test pad in the second direction.

公开(公告)号：US20170207138A1

公开(公告)日：2017-07-20

申请号：US15476189

申请日：2017-03-31

Applicant: Samsung Display Co., LTD.

Inventor： Ji-Yun HONG ,  Joon-Geol KIM ,  Jin-Won LEE ,  Ki-Won KIM

IPC: H01L21/66 ,  H01L27/12

CPC classification number: H01L22/32 ,  G09G3/006 ,  H01L22/14 ,  H01L27/1225 ,  H01L27/124 ,  H01L27/1259

Abstract: A display panel includes first and second test lines connected to the each of data lines, extending in the second direction, and arranged in the first direction, a first test pad electrically connected to the first test line, the first test pad and the first test line being formed from a same layer, and a second test pad electrically connected to the second test line through a contact hole formed through a first insulation layer and disposed adjacent to the first test pad in the second direction.

公开(公告)号：US20170064297A1

公开(公告)日：2017-03-02

申请号：US15058659

申请日：2016-03-02

Applicant: Samsung Display Co., LTD.

Inventor： Joon-Geol KIM ,  Si-Joon KIM ,  Hee-Seon KIM

IPC: H04N17/00

CPC classification number: H04N17/004 ,  G09G3/006 ,  G09G2330/10

Abstract: An array test device for a display panel includes a stage on which the display panel including a plurality of pixel circuits is disposed, a contact unit including a plurality of probe pins, an adjustment unit which adjusts the contact unit such that the probe pins contact a plurality of pads of the display panel, and a testing unit which applies an array test signal to the pixel circuits of the display panel through the probe pins and the pads, receives a test result signal from the pixel circuits through the pads and the probe pins, generates waveform information representing a waveform of the test result signal, and determines whether the pixel circuits are defective based on the waveform information.

Abstract translation: 一种用于显示面板的阵列测试装置，包括：其上设置有包括多个像素电路的显示面板的台，包括多个探针的接触单元，调节单元，使得探针与 显示面板的多个焊盘和通过探针和焊盘将阵列测试信号施加到显示面板的像素电路的测试单元，通过焊盘和探针引脚从像素电路接收测试结果信号 产生表示测试结果信号的波形的波形信息，并基于波形信息确定像素电路是否有缺陷。

公开(公告)号：US20150162354A1

公开(公告)日：2015-06-11

申请号：US14249176

申请日：2014-04-09

Applicant: Samsung Display Co., LTD.

Inventor： Kang-Moon JO ,  Joon-Geol KIM ,  Seung-Ho JUNG ,  Young-Joo CHOI

IPC: H01L27/12 ,  H01L21/02 ,  H01L27/15

CPC classification number: H01L27/1259 ,  H01L27/1225 ,  H01L27/124

Abstract: Rather than forming a data line continuously extending in one layer of a thin film transistor substrate, spaced apart segments of a first data connection pattern are formed in a same first layer as that of the gate lines but extending in a crossing direction. Spaced apart parts of a second data connection pattern are formed in a same second layer as that of the source electrodes of the substrate and also extending in the crossing direction. The segments of the first data connection pattern are connected to successive parts of the second data connection pattern to form completed data lines. In one embodiment, the gate lines of the first layer and the spaced apart segments of a first data connection pattern include a low resistivity metal such as copper.

Abstract translation: 不是形成在薄膜晶体管基板的一层中连续延伸的数据线，而是将第一数据连接图案的间隔开的部分形成在与栅极线相同的第一层中，但是在交叉方向上延伸。 第二数据连接图案的分开的部分形成在与基板的源电极相同的第二层中，并且在交叉方向上延伸。 第一数据连接模式的段连接到第二数据连接模式的连续部分以形成完成的数据线。 在一个实施例中，第一层的栅极线和第一数据连接图案的间隔开的段包括诸如铜的低电阻率金属。

公开(公告)号：US20150144940A1

公开(公告)日：2015-05-28

申请号：US14458152

申请日：2014-08-12

Applicant: Samsung Display Co., LTD.

Inventor： Ji-Yun HONG ,  Joon-Geol KIM ,  Jin-Won LEE ,  Ki-Won KIM

IPC: H01L21/66 ,  H01L27/12

CPC classification number: H01L22/32 ,  G09G3/006 ,  H01L22/14 ,  H01L27/1225 ,  H01L27/124 ,  H01L27/1259

Abstract: A display panel includes first to third test lines connected to the each of data lines, extending in the second direction, and arranged in the first direction, a first test pad electrically connected to the first test line, the first test pad and the first test line being formed from a same layer, a second test pad electrically connected to the second test line through a contact hole formed through a first insulation layer, and disposed adjacent to the first test pad in the second direction, a third test pad electrically connected to the third test line and disposed adjacent to the first test pad in the first direction, the third test pad and the third test line being formed from a same layer.

Abstract translation: 显示面板包括连接到每个数据线的第一至第三测试线，沿第二方向延伸并且沿第一方向布置，第一测试焊盘，电连接到第一测试线，第一测试焊盘和第一测试 线路由相同的层形成，第二测试焊盘通过形成在第一绝缘层上的接触孔电连接到第二测试线，并且沿第二方向设置成与第一测试焊盘相邻，第三测试焊盘电连接到 第三测试线并​​且在第一方向上与第一测试焊盘相邻设置，第三测试焊盘和第三测试线由相同的层形成。