公开(公告)号：US20170064297A1

公开(公告)日：2017-03-02

申请号：US15058659

申请日：2016-03-02

Applicant: Samsung Display Co., LTD.

Inventor： Joon-Geol KIM ,  Si-Joon KIM ,  Hee-Seon KIM

IPC: H04N17/00

CPC classification number: H04N17/004 ,  G09G3/006 ,  G09G2330/10

Abstract: An array test device for a display panel includes a stage on which the display panel including a plurality of pixel circuits is disposed, a contact unit including a plurality of probe pins, an adjustment unit which adjusts the contact unit such that the probe pins contact a plurality of pads of the display panel, and a testing unit which applies an array test signal to the pixel circuits of the display panel through the probe pins and the pads, receives a test result signal from the pixel circuits through the pads and the probe pins, generates waveform information representing a waveform of the test result signal, and determines whether the pixel circuits are defective based on the waveform information.

Abstract translation: 一种用于显示面板的阵列测试装置，包括：其上设置有包括多个像素电路的显示面板的台，包括多个探针的接触单元，调节单元，使得探针与 显示面板的多个焊盘和通过探针和焊盘将阵列测试信号施加到显示面板的像素电路的测试单元，通过焊盘和探针引脚从像素电路接收测试结果信号 产生表示测试结果信号的波形的波形信息，并基于波形信息确定像素电路是否有缺陷。