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公开(公告)号:US20040192048A1
公开(公告)日:2004-09-30
申请号:US10821944
申请日:2004-04-12
申请人: SHOWA DENKO K.K.
发明人: Hideki Hayashida , Taizo Ito , Yasuyuki Sakaguchi
IPC分类号: C30B001/00 , H01L021/20 , H01L021/36 , H01L021/302 , H01L021/461
CPC分类号: C01C1/003 , C01C1/024 , C01P2002/82 , C01P2006/82 , C23C16/303 , C23C16/4402 , C23C16/4481 , C30B25/02 , C30B29/403 , C30B29/406 , Y10S438/905
摘要: Ammonia for use in the manufacture of a GaN-type compound semiconductor, filled in a charging container 18 such that at least a part of the ammonia is liquid and the liquid phase ammonia has a water concentration determined by a Fourier-transform infrared spectroscopy (FT-IR) of 0.5 vol ppm or less, is introduced in the gaseous state into a reaction chamber 11 housing therein a substrate 1, and a layer comprising a GaN-type compound started from this ammonia is formed on the substrate 1.