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公开(公告)号：US20220172938A1
公开(公告)日：2022-06-02
申请号：US17474617
申请日：2021-09-14
Applicant: SHIMADZU CORPORATION
Inventor： Yoshihiro UENO
Abstract: In order to suppress a charge-up in an ion source configured to ionize a component contained in a sample gas, a mass spectrometer according to the present invention is provided with an ion source (3) including: an ionization chamber (30) having an ion ejection opening (301) and internally having a space substantially separated from an outside area; a repeller electrode (31), located within the ionization chamber, for creating an expelling electric field which acts on an ion generated within the ionization chamber to expel the ion through the ion ejection opening to the outside area; and a voltage generator (7) configured to selectively apply, to the repeller electrode, a first voltage for creating the expelling electric field and a second voltage for creating a charge-up-removing electric field, where the second voltage is a positive voltage having a larger absolute value than the first voltage.
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公开(公告)号：US20190035618A1
公开(公告)日：2019-01-31
申请号：US15775224
申请日：2015-11-11
Applicant: SHIMADZU CORPORATION
Inventor： Hiroko UEDA , Shinji MIYAUCHI , Yoshihiro UENO
IPC: H01J49/42
Abstract: A pre-electrode unit (32) placed in front of a main electrode unit (31) have a two-stage configuration. A front pre-electrode unit (32A) and rear pre-electrode unit (32B) are respectively supplied with radio-frequency voltages whose frequency is the same as that of a radio-frequency voltage applied to rod electrodes in the main electrode unit (31), and whose amplitude decreases in a stepwise manner toward the front side. Decreasing the amplitude of a radio-frequency voltage increases the ion acceptance. Therefore, by appropriately adjusting the amplitudes, the matching between the emittance of an incoming ion beam and the acceptance can be improved. The ion transmittance of the entire quadrupole mass filter (3) is significantly affected by the ion transmittance at the point of entry of the ion into the pre-electrode unit (32) as well as the ion transmittance at the point of entry of the ion from the pre-electrode unit (32) into the main electrode unit (31), rather than the ion transmittance within the pre-electrode unit (32). Therefore, the ion transmittance of the quadrupole mass filter (3) can be enhanced by improving those transmittances.
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公开(公告)号：US20170229275A1
公开(公告)日：2017-08-10
申请号：US15501935
申请日：2014-08-08
Applicant: SHIMADZU CORPORATION
Inventor： Yoshihiro UENO , Hiroshi SEKI , Hiroshi OKUDA
CPC classification number: H01J27/024 , B03C7/02 , G01N15/0266 , G01N27/62 , G01N27/622 , G01N2015/0038 , H01J37/32009 , H01J37/32082 , H01J37/321 , H01J37/32357 , H01J37/3244 , H01J37/32532 , H01J49/10 , H01J49/12
Abstract: A particle charger is provided with: a filter (28) partitioning the inside of a housing (20) into a first space (29) and second space (30); a particle introducer (22) for introducing a particle into the first space; a gas ion supplier (10) for supplying the first space with a gas ion; a potential gradient creator (26, 27, 31) for creating a potential difference within the housing so as to make the gas ion and a charged particle resulting from a contact of the aforementioned particle with the gas ion move toward the second space; an AC voltage supplier (32, 33) for applying AC voltages having a phase difference to the neighboring electrodes (28a, b) included in the filter; a controller (35) for performing a control for applying, to the plurality of electrodes, predetermined voltages so as to allow the charged particle to pass through a gap between the electrodes while trapping the gas ion by the electrodes; and a charged particle extractor (23, 25, 34) for extracting the charged particle admitted to the second space to the outside of the housing. By this configuration, the occurrence frequency of the multi-charging is suppressed.
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公开(公告)号：US20240186134A1
公开(公告)日：2024-06-06
申请号：US18285119
申请日：2021-05-14
Applicant: Shimadzu Corporation
Inventor： Yoshihiro UENO
CPC classification number: H01J49/147 , H01J49/061 , H01J49/4215
Abstract: One mode of the mass spectrometer according to the present invention is a mass spectrometer including an ion source configured to ionize a component contained in a sample gas, the ion source (3) including: an ionization chamber (30) having an ion ejection opening (301) and forming a space substantially partitioned from an outside inside the ionization chamber; a thermal electron supply unit (32) configured to supply thermal electrons to an inside of the ionization chamber; a magnetic field forming unit (34, 35) configured to form a magnetic field inside the ionization chamber such that the thermal electrons move helically; and a deflection electric field forming unit (37, 7) configured to form a deflection electric field deflecting ions derived from the component generated in the ionization chamber by a direct or indirect action of the thermal electrons in a direction against a force received from the magnetic field when the ions are moving toward the ion ejection opening.
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公开(公告)号：US20170138904A1
公开(公告)日：2017-05-18
申请号：US15338752
申请日：2016-10-31
Applicant: SHIMADZU CORPORATION
Inventor： Yoshihiro UENO
IPC: G01N27/62 , G01N27/447
CPC classification number: G01N27/622 , G01N27/447
Abstract: A drift voltage generator under the control of the control unit applies a rectangular waveform voltage to each annular electrode so as to form alternately in times a uniform accelerating electric field for accelerating the ions introduced to the drift region toward the end of the drift tube and a uniform decelerating electric field for decelerating the ions. The control unit adjusts the duty ratio of the rectangular waveform voltage according to the preset degree of separation. By forming a decelerating electric field periodically, the average movement speed of ions becomes slow compared to the case of forming an accelerating electric field continuously. Thereby, the drift time becomes longer despite of the same drift distance, enlarging the difference of time for the two types of ions having different mobility to arrive at the detector, improving the degree of separation.
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Patent Agency Ranking
公开(公告)号：US20210296108A1
公开(公告)日：2021-09-23
申请号：US16330640
申请日：2016-10-11
Applicant: SHIMADZU CORPORATION
Inventor： Yusuke TATEISHI , Yoshihiro UENO , Shinji MIYAUCHI
Abstract: An ion guide (222) is for use in transport of an ion incident from an upstream side toward a downstream side. The ion guide includes 2n rod electrodes (n is an integral number greater than or equal to 2) equally spaced and surrounding an ion optical axis (C) that is a central axis of a flight path of the ion, a voltage applying unit (30) that applies a radio-frequency voltage to the 2n rod electrodes, and a controller (43) that controls the voltage applying unit (30). The controller (43) prompts the voltage applying unit (30) to apply a radio-frequency voltage that generates, in a space surrounded by the 2n rod electrodes, an electric field which is a 2n-multipole electric field superimposed by a higher-order electric field component than the 2n-multipole electric field.
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公开(公告)号：US20160363544A1
公开(公告)日：2016-12-15
申请号：US14735112
申请日：2015-06-09
Applicant: SHIMADZU CORPORATION
Inventor： Yusuke TAGAWA , Hiroshi OOHARA , Yoshihiro UENO
CPC classification number: G01N23/046 , G01T7/08
Abstract: In an X-ray inspecting apparatus, a rotational fluctuation amount of a stage is calculated around a power transmission part of the stage and a stage drive unit as a base point, i.e., the X-axis and Y-axis sliding parts, in accordance with detected positional information from a position detecting sensor. Then, a stage shift amount is calculated in accordance with the rotational fluctuation amount and a distance between the base point and an imaging position on the stage. Here, the stage shift amount corresponds to a positional deviation of the stage at the imaging position caused by an attitude variation of the stage in a yawing direction, and thus is an error in repeated positioning. Accordingly, a tomographic image with high resolution can be generated in consideration of the error in repeated positioning.
Abstract translation: 在X射线检查装置中，在台架的动力传递部分和作为基点的台架驱动单元（即，X轴和Y轴滑动部件）周围计算阶段的旋转变动量 检测来自位置检测传感器的位置信息。 然后，根据旋转变动量和基点与台面上的摄像位置之间的距离来计算舞台偏移量。 这里，舞台偏移量对应于由舞台在偏航方向上的姿态变化引起的成像位置处的舞台的位置偏差，因此是重复定位中的错误。 因此，考虑到重复定位中的误差，可以产生具有高分辨率的断层图像。
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公开(公告)号：US20170138831A1
公开(公告)日：2017-05-18
申请号：US15323579
申请日：2015-06-26
Inventor： Hiroshi OKUDA , Yoshihiro UENO , Hiroshi SEKI , Hiromu SAKURAI
CPC classification number: G01N15/0266 , B03C3/017 , B03C3/361 , B03C3/38 , B03C3/41 , B03C3/47 , B03C3/68 , B03C7/02 , B03C2201/06 , G01N2015/0038 , G01N2015/0288 , H01T19/04 , H01T23/00
Abstract: In unipolar charging, a discharge current value at which charging efficiency is best and a discharge current dependency of multivalent charging differ depending on the particle size of the particles that are the object of charging. Therefore, for each particle size, a discharge voltage at which univalent charging efficiency is best and a discharge voltage at which the signal-to-noise ratio of a signal when particles of a different size are regarded as noise is best are obtained through experiment and stored in a storage unit (21). When scanning a classification voltage that is applied to a classification unit (32) of a DMA (3) to measure particle size distribution, a system controlling unit (2) acquires an optimal voltage corresponding to a particle size from the storage unit (21), and in conjunction with scanning of the classification voltage, controls a discharge power source (11) via a discharge voltage controlling unit (10) so that the discharge voltage is scanned in accordance with changes in particle size. It is thereby possible, for example, to reduce the amount of multivalent charged particles of different particle sizes that are mixed in with particles with a predetermined particle size that are extracted by classification, and to accurately determine the particle size distribution.
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公开(公告)号：US20220285143A1
公开(公告)日：2022-09-08
申请号：US17632293
申请日：2020-08-11
Applicant: SHIMADZU CORPORATION
Inventor： Yoshihiro UENO , Ryugo MAEDA , Yusuke TATEISHI , Hiroyuki MIURA
Abstract: An MT-TOFMS which is one mode of the present invention includes: a linear ion trap (2) configured to temporarily hold ions to be analyzed, and to eject the ions through an ion ejection opening (211) having a shape elongated in one direction; a loop flight section (3) configured to form a loop path (P) capable of making ions repeatedly fly; and a slit part (5) located on an ion path in which the ions ejected from the linear ion trap (2) travel until the ions are introduced into the loop path, the slit part configured to block a portion of the ions in a longitudinal direction of the ion ejection opening (211).
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公开(公告)号：US20190051508A1
公开(公告)日：2019-02-14
申请号：US15780932
申请日：2015-12-02
Applicant: SHIMADZU CORPORATION
Inventor： Shinji MIYAUCHI , Hiroko UEDA , Yoshihiro UENO
Abstract: Four main rod electrodes included in a main electrode section are disposed in a rotationally symmetric manner around an ion optical axis. Among four pre-rod electrodes included in a pre-electrode section disposed in front of the main electrode section, two are in contact with a circle of a radius r0, whereas the other two are disposed to be in contact with a circle of a radius R0 larger than r0, resulting in rotational asymmetry around the ion optical axis. Accordingly, a shape of acceptance on an x-y plane regarding positions of ions in the pre-electrode section becomes elliptical. This allows the shape of the acceptance to become gradually flat as the ions travel along the ion optical axis, reducing a mismatch between emittance of incoming ions and the acceptance on a receiving side, and relieving ion loss during ion introduction.
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