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公开(公告)号:US20240282663A1
公开(公告)日:2024-08-22
申请号:US18635186
申请日:2024-04-15
发明人: Seungwon IM , Dongwook KANG , Oseob JEON
IPC分类号: H01L23/373 , H01L23/31 , H01L23/367 , H01L23/473 , H01L25/07
CPC分类号: H01L23/3735 , H01L23/3107 , H01L23/3672 , H01L23/473 , H01L25/072
摘要: In a general aspect, an electronic device assembly can include a semiconductor device assembly including a ceramic substrate; a patterned metal layer disposed on a first surface of the ceramic substrate; and a semiconductor die disposed on the patterned metal layer. The electronic device assembly can also include a thermal dissipation appliance. Ceramic material of a second surface of the ceramic substrate can be direct-bonded to a surface of the thermal dissipation appliance. The second surface of the ceramic substrate can be opposite the first surface of the ceramic substrate.
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公开(公告)号:US20240186211A1
公开(公告)日:2024-06-06
申请号:US18441484
申请日:2024-02-14
发明人: Jooyang EOM , Inpil YOO , Seungwon IM , Byoungok LEE
IPC分类号: H01L23/367 , H01L21/48
CPC分类号: H01L23/3672 , H01L21/4882
摘要: In a general aspect, an apparatus includes a substrate and a metal layer disposed on a surface of the substrate. The apparatus also includes a first recess and a second recess formed in the metal layer, and a folded cooling fin. A first portion of the folded cooling fin is disposed within the first recess and coupled with the metal layer, and a second portion of the folded cooling fin is disposed in the second recess and coupled with the metal layer.
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公开(公告)号:US20240162110A1
公开(公告)日:2024-05-16
申请号:US18054229
申请日:2022-11-10
发明人: Seungwon IM , Jeungdae KIM , Oseob JEON , Byoungok LEE
IPC分类号: H01L23/373 , H01L21/56 , H01L23/31 , H01L23/42 , H01L23/495
CPC分类号: H01L23/3735 , H01L21/56 , H01L23/3107 , H01L23/42 , H01L23/49503 , H01L24/32 , H01L2224/32245
摘要: In a general aspect, a semiconductor device package can include a die attach paddle having a first surface and a second surface that is opposite the first surface; a semiconductor die coupled with the first surface of the die attach paddle, and a direct-bonded-metal (DBM) substrate The DBM substrate can include a ceramic layer having a first surface and a second surface that is opposite the first surface, a first metal layer disposed on the first surface of the ceramic layer and coupled with the second surface of the die attach paddle, a second metal layer disposed on the second surface of the ceramic layer, and a thermally conductive adhesive disposed on the second metal layer, At least a surface of the thermally conductive adhesive can be exposed external to the device package. The thermally conductive adhesive can be configured for coupling the device package with a thermal dissipation appliance.
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公开(公告)号:US20240120253A1
公开(公告)日:2024-04-11
申请号:US18182552
申请日:2023-03-13
发明人: Oseob JEON , Dongwook KANG , Seungwon IM , Jihwan KIM
IPC分类号: H01L23/373 , H01L21/48 , H01L21/56 , H01L23/31 , H01L23/367 , H01L23/495
CPC分类号: H01L23/373 , H01L21/4846 , H01L21/56 , H01L23/3107 , H01L23/3672 , H01L23/49568 , H01L24/32 , H01L2224/32245
摘要: An integrated substrate may include a conductor layer; a heat sink including a plurality of fins extending therefrom; and a dielectric layer including boron nitride chemically bonded to the conductor layer and to the heat sink with an epoxy.
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公开(公告)号:US20230361011A1
公开(公告)日:2023-11-09
申请号:US18308467
申请日:2023-04-27
发明人: Seungwon IM , Oseob JEON
IPC分类号: H01L23/498 , H01L23/31 , H01L23/433
CPC分类号: H01L23/49811 , H01L23/3121 , H01L23/4334
摘要: In a general aspect, an electronic device assembly includes a substrate having a surface, a patterned metal layer disposed on the surface of the substrate, a semiconductor device circuit implemented on the patterned metal layer, and a molded body including a plurality of signal pin. A signal pin of the plurality of signal pins includes a first portion extending out of a first surface of the molded body. The first portion is externally accessible. The signal pin of the plurality of signal pins also includes a second portion extending out of a second surface of the molded body opposite the first surface. The second portion of the signal pin of the plurality of signal pins include is internal to the electronic device assembly, is electrically coupled with the patterned metal layer, and is electrically continuous with the first portion.
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公开(公告)号:US20220199602A1
公开(公告)日:2022-06-23
申请号:US17247797
申请日:2020-12-23
发明人: Jonghwan BAEK , JeongHyuk PARK , Seungwon IM , Keunhyuk LEE
IPC分类号: H01L25/18 , H01L23/495 , H01L23/367 , H01L23/31 , H01L23/00 , H01L25/00
摘要: Described implementations provide wireless, surface mounting of at least two semiconductor die on die attach pads (DAPs) of the semiconductor package, where the at least two semiconductor die are electrically connected by a clip. A stress buffer layer may be provided on the clip, and a heatsink may be provided on the stress buffer layer. The heatsink may be secured with an external mold material.
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公开(公告)号:US20210066256A1
公开(公告)日:2021-03-04
申请号:US16671450
申请日:2019-11-01
发明人: Seungwon IM , ByoungOk LEE , Oseob JEON
IPC分类号: H01L25/07 , H01L23/498 , H01L23/00 , H01L23/31 , H01L21/56
摘要: In a general aspect, a semiconductor device can include a substrate and a positive power supply terminal electrically coupled with the substrate, the positive power supply terminal being arranged in a first plane. The device can also include a first negative power supply terminal, laterally disposed from the positive power supply terminal and arranged in the first plane. The device can further include a second negative power supply terminal, laterally disposed from the positive power supply terminal and arranged in the first plane. The positive power supply terminal can be disposed between the first and second negative power supply terminals. The device can also include a conductive clip electrically coupling the first negative power supply terminal with the second negative power supply terminal via a conductive bridge. A portion of the conductive bridge can be arranged in a second plane that is parallel to, and non-coplanar with the first plane.
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公开(公告)号:US20180315681A1
公开(公告)日:2018-11-01
申请号:US15714539
申请日:2017-09-25
发明人: Seungwon IM , Oseob JEON , Byoungok LEE , Yoonsoo LEE , Joonseo SON , Dukyong LEE , Changyoung PARK
IPC分类号: H01L23/433 , H01L23/24 , H01L25/065 , H01L23/498 , H01L23/13
摘要: Implementations of semiconductor packages may include a first substrate coupled to a first die, a second substrate coupled to a second die, and a spacer included within a perimeter of the first substrate and within a perimeter of a second substrate, the spacer coupled between the first die and the second die, the spacer include a junction cooling pipe therethrough.
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公开(公告)号:US20240194564A1
公开(公告)日:2024-06-13
申请号:US18444251
申请日:2024-02-16
发明人: Jihwan KIM , Oseob JEON , Seungwon IM , Dongwook KANG
IPC分类号: H01L23/473 , H01L23/15 , H01L23/31 , H01L25/065
CPC分类号: H01L23/473 , H01L23/15 , H01L23/3121 , H01L25/0652
摘要: In a general aspect, a semiconductor device module includes a ceramic substrate having a first surface and a second surface opposite the first surface, a patterned metal layer disposed on the first surface of the ceramic substrate, a semiconductor die disposed on the patterned metal layer, and a cooling structure disposed on the second surface of the ceramic substrate. The cooling structure includes a plurality of copper sheets defining a plurality of fluidic-cooling channels. At least one copper sheet of the plurality of copper sheets is at least one of coated or plated with a corrosion-resistant material. The module also includes a molding compound that encapsulates the ceramic substrate, the patterned metal layer and the semiconductor die. The molding compound also partially encapsulates the cooling structure, such that a fluidic interface surface of the cooling structure is exposed through the molding compound.
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公开(公告)号:US20240138069A1
公开(公告)日:2024-04-25
申请号:US18491456
申请日:2023-10-19
CPC分类号: H05K1/18 , H05K1/11 , H05K2201/10166
摘要: In a general aspect, a half-bridge circuit includes a substrate having first, second and third patterned metal layers disposed on a surface. The circuit also includes first and second high-side transistors disposed on the first patterned metal layer, and first and conductive clips electrically coupling, respectively, the first and second high-side transistors with the second patterned metal layer. The circuit also includes first and second low-side transistors disposed on the second patterned metal layer, and third and fourth conductive clips electrically coupling, respectively, the first and second low-side transistors with the third patterned metal layer. The circuit further includes a DC+ terminal electrically coupled with the first patterned metal layer via a first conductive post disposed between the first and second high-side transistors, and a DC− terminal electrically coupled with the third patterned metal layer via a second conductive post disposed between the third and fourth conductive clips.
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