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公开(公告)号:US20140017811A1
公开(公告)日:2014-01-16
申请号:US13939585
申请日:2013-07-11
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Su Bong BAE
IPC: G01N21/75
CPC classification number: G01N21/75 , B01L3/5027 , B01L3/502715 , B01L2200/025 , B01L2300/0806 , G01N21/07 , G01N2021/0325 , G01N2035/00158
Abstract: A test device and a control method thereof are provided. The test device includes a rotary drive unit to rotate the microfluidic device, a light emitting element to emit light onto the microfluidic device, a detection module arranged at a position facing the light emitting element and provided with a light receiving element to receive light emitted from the light emitting element and transmitted through the microfluidic device, a detection module drive unit to move the detection module in a radial direction, and a controller to control the rotary drive unit and the detection module drive unit.
Abstract translation: 提供了一种测试装置及其控制方法。 测试装置包括旋转驱动单元以旋转微流体装置,发光元件以将光发射到微流体装置上;检测模块,布置在面向发光元件的位置处并设置有光接收元件以接收从 所述发光元件通过所述微流体装置传输,所述检测模块驱动单元沿径向方向移动所述检测模块;以及控制器,用于控制所述旋转驱动单元和所述检测模块驱动单元。
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公开(公告)号:US20180120290A1
公开(公告)日:2018-05-03
申请号:US15686807
申请日:2017-08-25
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yeong Bae YEO , Sil PARK , Su Bong BAE
CPC classification number: G01N33/49 , B01L3/502715 , G01N21/0303 , G01N21/07 , G01N21/59 , G01N21/75 , G01N33/50 , G01N35/00069 , G01N35/00722 , G01N35/00732 , G01N2021/0325 , G01N2021/178 , G01N2021/8488 , G01N2035/00891 , G01N2201/0633 , G01N2201/064 , G01N2201/0642
Abstract: A test device, test system, and control method of the test device, which defines a light irradiating area in a reactor to prevent a decrease in magnitude of a detected signal that may result due to scattering of light that has penetrated other area of the reactor than an area containing an object for detection and improve a dynamic range. A test device may include a light source configured to irradiate light; a reactor configured to include at least one first area to contain an object for detection; and a photo detector configured to receive light that has been irradiated from the light source and has passed the reactor that contains the object for detection, wherein the light source is configured to limitedly irradiate the light to the first area of the reactor.
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