SYSTEM OF SEMICONDUCTOR PROCESS AND CONTROL METHOD THEREOF

    公开(公告)号:US20230005723A1

    公开(公告)日:2023-01-05

    申请号:US17709613

    申请日:2022-03-31

    Abstract: A semiconductor processing system includes: a semiconductor processing chamber including an electrostatic chuck disposed in a chamber housing, and a first power supplier for supplying first radio frequency (RF) power to an internal electrode disposed in the electrostatic chuck; a voltage measuring device for measuring a voltage corresponding to the first RF power to output a digital signal; and a control device for outputting an interlock control signal to the semiconductor processing chamber, when it is determined that the voltage increases to be within a predetermined reference range based on the digital signal. The electrostatic chuck is configured to enable a wafer to be seated on a surface of the electrostatic chuck.

Patent Agency Ranking