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公开(公告)号:US20240243090A1
公开(公告)日:2024-07-18
申请号:US18618133
申请日:2024-03-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jaekul LEE , Hyungsun JANG , Gayoung KIM , Minjeong SHIN
CPC classification number: H01L24/20 , H01L24/73 , H01L25/105 , H01L2224/2101 , H01L2224/2105 , H01L2224/221 , H01L2224/73101 , H01L2225/1035 , H01L2225/1041 , H01L2225/1058
Abstract: A semiconductor package includes a lower redistribution layer disposed on a lower surface of the semiconductor chip including an insulating layer, a redistribution pattern, a via, an under bump metal (UBM), and a post disposed on the redistribution pattern. The post vertically overlaps with the UBM. A mold layer is on the lower redistribution layer and surrounds the semiconductor chip. A connecting terminal is connected to the UBM. The UBM includes a first section contacting the redistribution pattern, and a second section contacting the insulating layer. The post has a ring shape having an inner surface and an outer surface when viewed in a top view. A maximum width of the inner surface is less than a maximum width of an upper surface of the first section. A maximum width of the outer surface is greater than the maximum width of the upper surface of the first section.
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公开(公告)号:US20220246568A1
公开(公告)日:2022-08-04
申请号:US17479042
申请日:2021-09-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jaekul LEE , Hyungsun JANG , Gayoung KIM , Minjeong SHIN
Abstract: A semiconductor package includes a lower redistribution layer disposed on a lower surface of the semiconductor chip including an insulating laver, a redistribution pattern, a via, an under bump metal (UBM), and a post disposed on the redistribution pattern. The post vertically overlaps with the UBM. A mold layer is on the lower redistribution layer and surrounds the semiconductor chip. A connecting terminal is connected to the UBM. The UBM includes a first section contacting the redistribution pattern, and a second section contacting the insulating layer. The lost has a ring shape having an inner surface and an outer surface when viewed a top view. A maximum width of the inner surface is less than a Maximum width of an upper surface of the first section. A maximum width of the outer surface is greater than the maximum width of the upper surface of the first section.
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